Welcome to IEEE AUTOTESTCON 2015 [President's Perspectives]

R. Zoughi; Robert J. Lyons

doi:10.1109/MIM.2015.7155765

Welcome to IEEE AUTOTESTCON 2015 [President's Perspectives]

R. Zoughi
, Robert J. Lyons

Research output: Contribution to journal › Article › peer-review

Abstract

On behalf of the IEEE Instrumentation and Measurement Society (IMS), it gives me great pleasure to welcome you to IEEE AUTOTESTCON 2015. IEEE AUTOTESTCON is a unique event that brings together colleagues interested and involved in automated testing, product development and their users. This is also a wonderful venue for meeting new colleagues to learn about each other's products and initiate new collaborations. As in years past, we at the IEEE IMS are extremely happy to continue our support of IEEE AUTOTESTCON 2015 along with the IEEE Aerospace and Electronic Systems Society (AESS). These two societies share several common goals that make our mutual support of this event a must.

National Harbor, Maryland, USA and its proximity to Washington, D.C. with all that is offered in our nations' capital, is sure to make this an exciting and rewarding experience, both technically and culturally. On behalf of the Society, I wish for you to have a wonderful experience at the IEEE AUTOTESTCON 2015.

Original language	American English
Journal	IEEE Instrumentation and Measurement Magazine
Volume	18
DOIs	https://doi.org/10.1109/MIM.2015.7155765
State	Published - Aug 1 2015

Disciplines

Electrical and Computer Engineering

Access to Document

10.1109/MIM.2015.7155765License: Unspecified

https://doi.org/10.1109/MIM.2015.7155765

Cite this

@article{2e8bed50d23c48d998adaf0fdee88857,

title = "Welcome to IEEE AUTOTESTCON 2015 [President's Perspectives]",

abstract = " On behalf of the IEEE Instrumentation and Measurement Society (IMS), it gives me great pleasure to welcome you to IEEE AUTOTESTCON 2015. IEEE AUTOTESTCON is a unique event that brings together colleagues interested and involved in automated testing, product development and their users. This is also a wonderful venue for meeting new colleagues to learn about each other's products and initiate new collaborations. As in years past, we at the IEEE IMS are extremely happy to continue our support of IEEE AUTOTESTCON 2015 along with the IEEE Aerospace and Electronic Systems Society (AESS). These two societies share several common goals that make our mutual support of this event a must. National Harbor, Maryland, USA and its proximity to Washington, D.C. with all that is offered in our nations' capital, is sure to make this an exciting and rewarding experience, both technically and culturally. On behalf of the Society, I wish for you to have a wonderful experience at the IEEE AUTOTESTCON 2015.",

author = "R. Zoughi and Lyons, \{Robert J.\}",

year = "2015",

month = aug,

day = "1",

doi = "10.1109/MIM.2015.7155765",

language = "American English",

volume = "18",

journal = "IEEE Instrumentation and Measurement Magazine",

issn = "1941-0123",

}

TY - JOUR

T1 - Welcome to IEEE AUTOTESTCON 2015 [President's Perspectives]

AU - Zoughi, R.

AU - Lyons, Robert J.

PY - 2015/8/1

Y1 - 2015/8/1

N2 - On behalf of the IEEE Instrumentation and Measurement Society (IMS), it gives me great pleasure to welcome you to IEEE AUTOTESTCON 2015. IEEE AUTOTESTCON is a unique event that brings together colleagues interested and involved in automated testing, product development and their users. This is also a wonderful venue for meeting new colleagues to learn about each other's products and initiate new collaborations. As in years past, we at the IEEE IMS are extremely happy to continue our support of IEEE AUTOTESTCON 2015 along with the IEEE Aerospace and Electronic Systems Society (AESS). These two societies share several common goals that make our mutual support of this event a must. National Harbor, Maryland, USA and its proximity to Washington, D.C. with all that is offered in our nations' capital, is sure to make this an exciting and rewarding experience, both technically and culturally. On behalf of the Society, I wish for you to have a wonderful experience at the IEEE AUTOTESTCON 2015.

AB - On behalf of the IEEE Instrumentation and Measurement Society (IMS), it gives me great pleasure to welcome you to IEEE AUTOTESTCON 2015. IEEE AUTOTESTCON is a unique event that brings together colleagues interested and involved in automated testing, product development and their users. This is also a wonderful venue for meeting new colleagues to learn about each other's products and initiate new collaborations. As in years past, we at the IEEE IMS are extremely happy to continue our support of IEEE AUTOTESTCON 2015 along with the IEEE Aerospace and Electronic Systems Society (AESS). These two societies share several common goals that make our mutual support of this event a must. National Harbor, Maryland, USA and its proximity to Washington, D.C. with all that is offered in our nations' capital, is sure to make this an exciting and rewarding experience, both technically and culturally. On behalf of the Society, I wish for you to have a wonderful experience at the IEEE AUTOTESTCON 2015.

UR - https://scholarsmine.mst.edu/ele_comeng_facwork/2520

UR - https://doi.org/10.1109/MIM.2015.7155765

U2 - 10.1109/MIM.2015.7155765

DO - 10.1109/MIM.2015.7155765

M3 - Article

SN - 1941-0123

VL - 18

JO - IEEE Instrumentation and Measurement Magazine

JF - IEEE Instrumentation and Measurement Magazine

ER -

Welcome to IEEE AUTOTESTCON 2015 [President's Perspectives]

Abstract

Disciplines

Access to Document

Other files and links

Fingerprint

Cite this