Utilization of buried capacitance™: A case study

Jun Fan; Norm Smith; Jim Knighten; John Andresakis; Yoshi Fukawa; Mark Harvey

Utilization of buried capacitance™: A case study

Jun Fan
, Norm Smith
, Jim Knighten
, John Andresakis
, Yoshi Fukawa
, Mark Harvey

Electrical and Computer Engineering

Teradata Corporation
Mitsui Kinzoku
TechDream
Sanmina-SCI

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	International Engineering Consortium - DesignCon 2008
Pages	420-436
Number of pages	17
State	Published - 2008
Event	DesignCon 2008 - Santa Clara, CA, United States Duration: Feb 4 2008 → Feb 7 2008

Publication series

Name	International Engineering Consortium - DesignCon 2008

Conference

Conference	DesignCon 2008
Country/Territory	United States
City	Santa Clara, CA
Period	2/4/08 → 2/7/08

ASJC Scopus Subject Areas

Computer Networks and Communications
Electrical and Electronic Engineering

Cite this

@inproceedings{c16aba6f8b2047edbdb454a6345fd516,

title = "Utilization of buried capacitance{\texttrademark}: A case study",

author = "Jun Fan and Norm Smith and Jim Knighten and John Andresakis and Yoshi Fukawa and Mark Harvey",

year = "2008",

language = "English",

isbn = "9781605603452",

series = "International Engineering Consortium - DesignCon 2008",

pages = "420--436",

booktitle = "International Engineering Consortium - DesignCon 2008",

note = "DesignCon 2008 ; Conference date: 04-02-2008 Through 07-02-2008",

}

TY - GEN

T1 - Utilization of buried capacitance™

T2 - DesignCon 2008

AU - Fan, Jun

AU - Smith, Norm

AU - Knighten, Jim

AU - Andresakis, John

AU - Fukawa, Yoshi

AU - Harvey, Mark

PY - 2008

Y1 - 2008

UR - https://www.scopus.com/pages/publications/84866382917

UR - https://www.scopus.com/pages/publications/84866382917#tab=citedBy

M3 - Conference contribution

AN - SCOPUS:84866382917

SN - 9781605603452

T3 - International Engineering Consortium - DesignCon 2008

SP - 420

EP - 436

BT - International Engineering Consortium - DesignCon 2008

Y2 - 4 February 2008 through 7 February 2008

ER -

Utilization of buried capacitance™: A case study

Publication series

Conference

ASJC Scopus Subject Areas

Other files and links

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Cite this