Ultra-low fluence irradiation with energetic heavy ion pulsed beam using a modified electrostatic raster scanner

Joseph T. Graham; José Olivares; Vicente Garcia Tavora; Esther Enríquez Pérez; Santanu Kumar Padhi; Miguel Crespillo; Gastón García López

doi:10.1088/1402-4896/adb5d4

Ultra-low fluence irradiation with energetic heavy ion pulsed beam using a modified electrostatic raster scanner

Joseph T. Graham
, José Olivares
, Vicente Garcia Tavora
, Esther Enríquez Pérez
, Santanu Kumar Padhi
, Miguel Crespillo
, Gastón García López

Nuclear Engineering and Radiation Science

Universidad Autónoma de Madrid
CSIC
University of Tennessee

Research output: Contribution to journal › Article › peer-review

Original language	English
Article number	035031
Journal	Physica Scripta
Volume	100
Issue number	3
DOIs	https://doi.org/10.1088/1402-4896/adb5d4
State	Published - Jan 2025

ASJC Scopus Subject Areas

Atomic and Molecular Physics, and Optics
Mathematical Physics
Condensed Matter Physics

Keywords

electrostatic chopping
ion fluence measurement
ion track etching
pulsed ion irradiation
swift ions

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10.1088/1402-4896/adb5d4

Cite this

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title = "Ultra-low fluence irradiation with energetic heavy ion pulsed beam using a modified electrostatic raster scanner",

keywords = "electrostatic chopping, ion fluence measurement, ion track etching, pulsed ion irradiation, swift ions",

author = "Graham, \{Joseph T.\} and Jos{\'e} Olivares and Tavora, \{Vicente Garcia\} and P{\'e}rez, \{Esther Enr{\'i}quez\} and Padhi, \{Santanu Kumar\} and Miguel Crespillo and L{\'o}pez, \{Gast{\'o}n Garc{\'i}a\}",

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language = "English",

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journal = "Physica Scripta",

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T1 - Ultra-low fluence irradiation with energetic heavy ion pulsed beam using a modified electrostatic raster scanner

AU - Graham, Joseph T.

AU - Olivares, José

AU - Tavora, Vicente Garcia

AU - Pérez, Esther Enríquez

AU - Padhi, Santanu Kumar

AU - Crespillo, Miguel

AU - López, Gastón García

PY - 2025/1

Y1 - 2025/1

KW - electrostatic chopping

KW - ion fluence measurement

KW - ion track etching

KW - pulsed ion irradiation

KW - swift ions

UR - https://www.scopus.com/pages/publications/86000326773

UR - https://www.scopus.com/pages/publications/86000326773#tab=citedBy

UR - https://www.mendeley.com/catalogue/1bfd565c-f6e7-36cc-984c-9b85b1875333/

U2 - 10.1088/1402-4896/adb5d4

DO - 10.1088/1402-4896/adb5d4

M3 - Article

AN - SCOPUS:86000326773

SN - 0031-8949

VL - 100

JO - Physica Scripta

JF - Physica Scripta

IS - 3

M1 - 035031

ER -

Ultra-low fluence irradiation with energetic heavy ion pulsed beam using a modified electrostatic raster scanner

ASJC Scopus Subject Areas

Keywords

Access to Document

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