@article{cc0b388279b848b0b791266fe66737b2,
title = "Traces in proximity to gaps in return planes",
keywords = "Analog, Common-impedance, Coupling, Digital, Gapped, Ground islands, Ground plane, Isolation, Moating, Mutual capacitance, Mutual inductance, Printed circuit board",
author = "Hubing, \{Todd H.\} and \{Van Doren\}, Thomas and Zeeff, \{Theodore M.\}",
year = "2005",
month = may,
doi = "10.1109/TEMC.2005.847405",
language = "English",
volume = "47",
pages = "388--392",
journal = "IEEE Transactions on Electromagnetic Compatibility",
issn = "0018-9375",
number = "2",
}