Thickness dependence of microstructure in semiconducting films of an oligofluorene derivative

Dean M. DeLongchamp; Mang Mang Ling; Youngsuk Jung; Daniel A. Fischer; Mark E. Roberts; Eric K. Lin; Zhenan Bao

doi:10.1021/ja064384q

Thickness dependence of microstructure in semiconducting films of an oligofluorene derivative

Dean M. DeLongchamp
, Mang Mang Ling
, Youngsuk Jung
, Daniel A. Fischer
, Mark E. Roberts
, Eric K. Lin
, Zhenan Bao

National Institute of Standards and Technology
Stanford University

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	16579-16586
Number of pages	8
Journal	Journal of the American Chemical Society
Volume	128
Issue number	51
DOIs	https://doi.org/10.1021/ja064384q
State	Published - Dec 27 2006
Externally published	Yes

ASJC Scopus Subject Areas

Catalysis
General Chemistry
Biochemistry
Colloid and Surface Chemistry

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10.1021/ja064384q

Cite this

@article{480b4ae364c04b0ab87d516ace1c83e3,

title = "Thickness dependence of microstructure in semiconducting films of an oligofluorene derivative",

author = "DeLongchamp, \{Dean M.\} and Ling, \{Mang Mang\} and Youngsuk Jung and Fischer, \{Daniel A.\} and Roberts, \{Mark E.\} and Lin, \{Eric K.\} and Zhenan Bao",

year = "2006",

month = dec,

day = "27",

doi = "10.1021/ja064384q",

language = "English",

volume = "128",

pages = "16579--16586",

journal = "Journal of the American Chemical Society",

issn = "0002-7863",

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T1 - Thickness dependence of microstructure in semiconducting films of an oligofluorene derivative

AU - DeLongchamp, Dean M.

AU - Ling, Mang Mang

AU - Jung, Youngsuk

AU - Fischer, Daniel A.

AU - Roberts, Mark E.

AU - Lin, Eric K.

AU - Bao, Zhenan

PY - 2006/12/27

Y1 - 2006/12/27

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UR - https://www.scopus.com/pages/publications/33845940666#tab=citedBy

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AN - SCOPUS:33845940666

SN - 0002-7863

VL - 128

SP - 16579

EP - 16586

JO - Journal of the American Chemical Society

JF - Journal of the American Chemical Society

IS - 51

ER -

Thickness dependence of microstructure in semiconducting films of an oligofluorene derivative

ASJC Scopus Subject Areas

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