Abstract
An Elementary Introduction to Surface Electromagnetic Waves (SEW) is Presented. the Emphasis is on Those Features of SEW Which Make Them Useful for Measuring Optical Properties of Thin Layers on Metals. the So-Called Two-Prism Technique for Making Such Measurements is Discussed, Some Preliminary Experimental Results Are Given, and Some Possible Applications Are Presented. © 1975.
| Original language | American English |
|---|---|
| Journal | Journal of Non-Crystalline Solids |
| Volume | 19 |
| DOIs | |
| State | Published - Jan 1 1975 |
Disciplines
- Physics
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