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The Use of Surface Electromagnetic Waves to Measure Materials Properties

  • Missouri University of Science and Technology

Research output: Contribution to journalArticlepeer-review

Abstract

An Elementary Introduction to Surface Electromagnetic Waves (SEW) is Presented. the Emphasis is on Those Features of SEW Which Make Them Useful for Measuring Optical Properties of Thin Layers on Metals. the So-Called Two-Prism Technique for Making Such Measurements is Discussed, Some Preliminary Experimental Results Are Given, and Some Possible Applications Are Presented. © 1975.

Original languageAmerican English
JournalJournal of Non-Crystalline Solids
Volume19
DOIs
StatePublished - Jan 1 1975

Disciplines

  • Physics

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