The impact of the dielectric / semiconductor interface on microstructure and charge carrier transport in high-performance polythiophene transistors

Youngsuk Jung; R. Joseph Kline; Eric K. Lin; Daniel A. Fischer; Michael F. Toney; Martin Heeney; Iain McCulloch; Dean M. DeLongchamp

doi:10.1149/1.2908623

The impact of the dielectric / semiconductor interface on microstructure and charge carrier transport in high-performance polythiophene transistors

Youngsuk Jung
, R. Joseph Kline
, Eric K. Lin
, Daniel A. Fischer
, Michael F. Toney
, Martin Heeney
, Iain McCulloch
, Dean M. DeLongchamp

National Institute of Standards and Technology
Stanford Synchrotron Radiation Laboratory
Queen Mary University of London
Imperial College London

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	ECS Transactions - Dielectrics for Nanosystems 3
Subtitle of host publication	Materials Science, Processing, Reliability, and Manufacturing
Pages	113-122
Number of pages	10
Edition	2
DOIs	https://doi.org/10.1149/1.2908623
State	Published - 2008
Externally published	Yes
Event	3rd International Symposium on Dielectrics for Nanosystems: Materials Science, Processing, Reliability and Manufacturing - 213th ECS Meeting - Phoenix, AZ, United States Duration: May 18 2008 → May 22 2008

Publication series

Name	ECS Transactions
Number	2
Volume	13
ISSN (Print)	1938-5862
ISSN (Electronic)	1938-6737

Conference

Conference	3rd International Symposium on Dielectrics for Nanosystems: Materials Science, Processing, Reliability and Manufacturing - 213th ECS Meeting
Country/Territory	United States
City	Phoenix, AZ
Period	5/18/08 → 5/22/08

ASJC Scopus Subject Areas

General Engineering

Access to Document

10.1149/1.2908623

Cite this

Jung, Y., Joseph Kline, R., Lin, E. K., Fischer, D. A., Toney, M. F., Heeney, M., McCulloch, I., & DeLongchamp, D. M. (2008). The impact of the dielectric / semiconductor interface on microstructure and charge carrier transport in high-performance polythiophene transistors. In ECS Transactions - Dielectrics for Nanosystems 3: Materials Science, Processing, Reliability, and Manufacturing (2 ed., pp. 113-122). (ECS Transactions; Vol. 13, No. 2). https://doi.org/10.1149/1.2908623

The impact of the dielectric / semiconductor interface on microstructure and charge carrier transport in high-performance polythiophene transistors. / Jung, Youngsuk; Joseph Kline, R.; Lin, Eric K. et al.
ECS Transactions - Dielectrics for Nanosystems 3: Materials Science, Processing, Reliability, and Manufacturing. 2. ed. 2008. p. 113-122 (ECS Transactions; Vol. 13, No. 2).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Jung, Y, Joseph Kline, R, Lin, EK, Fischer, DA, Toney, MF, Heeney, M, McCulloch, I & DeLongchamp, DM 2008, The impact of the dielectric / semiconductor interface on microstructure and charge carrier transport in high-performance polythiophene transistors. in ECS Transactions - Dielectrics for Nanosystems 3: Materials Science, Processing, Reliability, and Manufacturing. 2 edn, ECS Transactions, no. 2, vol. 13, pp. 113-122, 3rd International Symposium on Dielectrics for Nanosystems: Materials Science, Processing, Reliability and Manufacturing - 213th ECS Meeting, Phoenix, AZ, United States, 5/18/08. https://doi.org/10.1149/1.2908623

Jung Y, Joseph Kline R, Lin EK, Fischer DA, Toney MF, Heeney M et al. The impact of the dielectric / semiconductor interface on microstructure and charge carrier transport in high-performance polythiophene transistors. In ECS Transactions - Dielectrics for Nanosystems 3: Materials Science, Processing, Reliability, and Manufacturing. 2 ed. 2008. p. 113-122. (ECS Transactions; 2). doi: 10.1149/1.2908623

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author = "Youngsuk Jung and \{Joseph Kline\}, R. and Lin, \{Eric K.\} and Fischer, \{Daniel A.\} and Toney, \{Michael F.\} and Martin Heeney and Iain McCulloch and DeLongchamp, \{Dean M.\}",

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AU - Heeney, Martin

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The impact of the dielectric / semiconductor interface on microstructure and charge carrier transport in high-performance polythiophene transistors

Publication series

Conference

ASJC Scopus Subject Areas

Access to Document

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