Susceptibility Scanning as Failure Analysis Tool for System-Level Electrostatic Discharge (ESD) Problems

Giorgi Muchaidze; Jayong Koo; Qing Cai; Tun Li; Lijun Han; Andrew Martwick; Kai Wang; Jin Min; James L. Drewniak; David Pommerenke

doi:10.1109/TEMC.2008.921059

Susceptibility Scanning as Failure Analysis Tool for System-Level Electrostatic Discharge (ESD) Problems

Giorgi Muchaidze
, Jayong Koo
, Qing Cai
, Tun Li
, Lijun Han
, Andrew Martwick
, Kai Wang
, Jin Min
, James L. Drewniak
, David Pommerenke

Electrical and Computer Engineering

Missouri University of Science and Technology

Research output: Contribution to journal › Article › peer-review

Abstract

Susceptibility scanning is an increasingly adopted method for root cause analysis of system-level immunity sensitivities. It allows localizing affected nets and integrated circuits (ICs). Further, it can be used to compare the immunity of functionally identical or similar ICs or circuit boards. This paper explains the methodology as applied to electrostatic discharge and provides examples of scan maps and signals probed during immunity scanning. Limitations of present immunity analysis methods are discussed.

Original language	American English
Journal	IEEE Transactions on Electromagnetic Compatibility
Volume	50
DOIs	https://doi.org/10.1109/TEMC.2008.921059
State	Published - May 1 2008

Keywords

Color
Couplings
Electrostatic Discharge
Electrostatic Discharges (ESDs)
Failure Analysis
Immunity
Immunity Testing
Integrated Circuits
Magnetic Susceptibility
Noise
Probes
Scanning
Sensitivity Analysis
Susceptibility
Susceptibility Scanning
System-Level Immunity Sensitivities

Disciplines

Electrical and Computer Engineering

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10.1109/TEMC.2008.921059License: Unspecified

Susceptibility Scanning as Failure Analysis Tool for System-LevelFinal published version, 1.12 MBLicense: Unspecified

Cite this

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title = "Susceptibility Scanning as Failure Analysis Tool for System-Level Electrostatic Discharge (ESD) Problems",

abstract = " Susceptibility scanning is an increasingly adopted method for root cause analysis of system-level immunity sensitivities. It allows localizing affected nets and integrated circuits (ICs). Further, it can be used to compare the immunity of functionally identical or similar ICs or circuit boards. This paper explains the methodology as applied to electrostatic discharge and provides examples of scan maps and signals probed during immunity scanning. Limitations of present immunity analysis methods are discussed.",

keywords = "Color, Couplings, Electrostatic Discharge, Electrostatic Discharges (ESDs), Failure Analysis, Immunity, Immunity Testing, Integrated Circuits, Magnetic Susceptibility, Noise, Probes, Scanning, Sensitivity Analysis, Susceptibility, Susceptibility Scanning, System-Level Immunity Sensitivities",

author = "Giorgi Muchaidze and Jayong Koo and Qing Cai and Tun Li and Lijun Han and Andrew Martwick and Kai Wang and Jin Min and Drewniak, \{James L.\} and David Pommerenke",

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doi = "10.1109/TEMC.2008.921059",

language = "American English",

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T1 - Susceptibility Scanning as Failure Analysis Tool for System-Level Electrostatic Discharge (ESD) Problems

AU - Muchaidze, Giorgi

AU - Koo, Jayong

AU - Cai, Qing

AU - Li, Tun

AU - Han, Lijun

AU - Martwick, Andrew

AU - Wang, Kai

AU - Min, Jin

AU - Drewniak, James L.

AU - Pommerenke, David

PY - 2008/5/1

Y1 - 2008/5/1

N2 - Susceptibility scanning is an increasingly adopted method for root cause analysis of system-level immunity sensitivities. It allows localizing affected nets and integrated circuits (ICs). Further, it can be used to compare the immunity of functionally identical or similar ICs or circuit boards. This paper explains the methodology as applied to electrostatic discharge and provides examples of scan maps and signals probed during immunity scanning. Limitations of present immunity analysis methods are discussed.

AB - Susceptibility scanning is an increasingly adopted method for root cause analysis of system-level immunity sensitivities. It allows localizing affected nets and integrated circuits (ICs). Further, it can be used to compare the immunity of functionally identical or similar ICs or circuit boards. This paper explains the methodology as applied to electrostatic discharge and provides examples of scan maps and signals probed during immunity scanning. Limitations of present immunity analysis methods are discussed.

KW - Color

KW - Couplings

KW - Electrostatic Discharge

KW - Electrostatic Discharges (ESDs)

KW - Failure Analysis

KW - Immunity

KW - Immunity Testing

KW - Integrated Circuits

KW - Magnetic Susceptibility

KW - Noise

KW - Probes

KW - Scanning

KW - Sensitivity Analysis

KW - Susceptibility

KW - Susceptibility Scanning

KW - System-Level Immunity Sensitivities

UR - https://scholarsmine.mst.edu/ele_comeng_facwork/1286

U2 - 10.1109/TEMC.2008.921059

DO - 10.1109/TEMC.2008.921059

M3 - Article

SN - 1558-187X

VL - 50

JO - IEEE Transactions on Electromagnetic Compatibility

JF - IEEE Transactions on Electromagnetic Compatibility

ER -

Susceptibility Scanning as Failure Analysis Tool for System-Level Electrostatic Discharge (ESD) Problems

Abstract

Keywords

Disciplines

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