Skip to main navigation Skip to search Skip to main content

Stressed-biased actuators: Fatigue and lifetime

  • U.S. Army Research Laboratory

Research output: Contribution to journalConference articlepeer-review

Original languageEnglish
Pages (from-to)249-255
Number of pages7
JournalIntegrated Ferroelectrics
Volume71
DOIs
StatePublished - 2005
EventSymposium on Ferroelectricity and Piezoelectricity, IMRC 2004 - Cancun, Mexico
Duration: Aug 22 2004Aug 26 2004

ASJC Scopus Subject Areas

  • Electronic, Optical and Magnetic Materials
  • Control and Systems Engineering
  • Ceramics and Composites
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

Keywords

  • Actuators
  • Domain pinning
  • Fatigue
  • Micro-cracking
  • Stress-biased
  • Thunder

Fingerprint

Dive into the research topics of 'Stressed-biased actuators: Fatigue and lifetime'. Together they form a unique fingerprint.

Cite this