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Stochastic Partial Inductance for the Power Integrity Analysis by Polynomial Chaos Expansion

  • The University of Hong Kong
  • Missouri University of Science and Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original languageEnglish
Title of host publicationEMC COMPO 2019 - 2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages132-134
Number of pages3
ISBN (Electronic)9781728142616
DOIs
StatePublished - Oct 2019
Event12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMC COMPO 2019 - Haining, Hangzhou, China
Duration: Oct 21 2019 → Oct 23 2019

Publication series

NameEMC COMPO 2019 - 2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits

Conference

Conference12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMC COMPO 2019
Country/TerritoryChina
CityHaining, Hangzhou
Period10/21/19 → 10/23/19

ASJC Scopus Subject Areas

  • Instrumentation
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality
  • Radiation

Keywords

  • decoupling capacitor (decap) connection pads
  • partial element equivalent circuit (PEEC)
  • polynomial chaos expansion (PCE)
  • power integrity (PI)
  • stochastic partial inductance
  • uncertainty quantification

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