Statistical BER Analysis due to Supply Voltage Fluctuations at a Single-Ended Buffer

Jingook Kim; Dongil Shin; Junho Lee; Sunki Cho; Chulsoon Hwang; Jun Fan

Statistical BER Analysis due to Supply Voltage Fluctuations at a Single-Ended Buffer

Jingook Kim
, Dongil Shin
, Junho Lee
, Sunki Cho
, Chulsoon Hwang
, Jun Fan

Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

A statistical BER analysis due to arbitrary supply voltage fluctuations at a single ended buffer is proposed based on analytical expressions. The probability density of jitter and the BER eye diagrams are calculated using a piecewise linear model of buffer I-V curves. The proposed analysis method is validated by comparison with HSPICE simulations. The statistical BER analysis would be very useful for quick estimation of BER due to an arbitrary supply fluctuation at a buffer.

Original language	American English
Journal	Proceedings of DesignCon 2013 (2013, Santa Clara, CA)
Volume	2
State	Published - Jan 1 2013

Keywords

Piecewise Linear Techniques

Disciplines

Electrical and Computer Engineering

Cite this

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title = "Statistical BER Analysis due to Supply Voltage Fluctuations at a Single-Ended Buffer",

abstract = " A statistical BER analysis due to arbitrary supply voltage fluctuations at a single ended buffer is proposed based on analytical expressions. The probability density of jitter and the BER eye diagrams are calculated using a piecewise linear model of buffer I-V curves. The proposed analysis method is validated by comparison with HSPICE simulations. The statistical BER analysis would be very useful for quick estimation of BER due to an arbitrary supply fluctuation at a buffer.",

keywords = "Piecewise Linear Techniques",

author = "Jingook Kim and Dongil Shin and Junho Lee and Sunki Cho and Chulsoon Hwang and Jun Fan",

year = "2013",

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day = "1",

language = "American English",

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journal = "Proceedings of DesignCon 2013 (2013, Santa Clara, CA)",

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T1 - Statistical BER Analysis due to Supply Voltage Fluctuations at a Single-Ended Buffer

AU - Kim, Jingook

AU - Shin, Dongil

AU - Lee, Junho

AU - Cho, Sunki

AU - Hwang, Chulsoon

AU - Fan, Jun

PY - 2013/1/1

Y1 - 2013/1/1

N2 - A statistical BER analysis due to arbitrary supply voltage fluctuations at a single ended buffer is proposed based on analytical expressions. The probability density of jitter and the BER eye diagrams are calculated using a piecewise linear model of buffer I-V curves. The proposed analysis method is validated by comparison with HSPICE simulations. The statistical BER analysis would be very useful for quick estimation of BER due to an arbitrary supply fluctuation at a buffer.

AB - A statistical BER analysis due to arbitrary supply voltage fluctuations at a single ended buffer is proposed based on analytical expressions. The probability density of jitter and the BER eye diagrams are calculated using a piecewise linear model of buffer I-V curves. The proposed analysis method is validated by comparison with HSPICE simulations. The statistical BER analysis would be very useful for quick estimation of BER due to an arbitrary supply fluctuation at a buffer.

KW - Piecewise Linear Techniques

UR - https://scholarsmine.mst.edu/ele_comeng_facwork/2368

M3 - Article

VL - 2

JO - Proceedings of DesignCon 2013 (2013, Santa Clara, CA)

JF - Proceedings of DesignCon 2013 (2013, Santa Clara, CA)

ER -

Statistical BER Analysis due to Supply Voltage Fluctuations at a Single-Ended Buffer

Abstract

Keywords

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