Statistical Approach to the EMI Modeling of Large ASICs by a Single Noise-Current Source

Giulio Antonini; James L. Drewniak; Marco Leone; Antonio Orlandi; Vittorio Ricchiuti

doi:10.1109/EPEP.2003.1250065

Statistical Approach to the EMI Modeling of Large ASICs by a Single Noise-Current Source

Giulio Antonini
, James L. Drewniak
, Marco Leone
, Antonio Orlandi
, Vittorio Ricchiuti

Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

Large and complex ASICs are source of propagating noise inside the powerbus planes. A lumped noise source model is proposed and validated by means of a statistics based method.

Original language	American English
Journal	Proceedings of Electrical Performance of Electronic Packaging (2003, Princeton, NJ)
DOIs	https://doi.org/10.1109/EPEP.2003.1250065
State	Published - Oct 1 2003

Keywords

Application Specific Integrated Circuits
Cavity-Resonator Model
EMI Modeling
Electromagnetic Interference
Fast Transient Current
Frequency Response
Integrated Circuit Modelling
Integrated Circuit Noise
Large Complex ASIC
Lumped Noise Source Model
Power Supplying Pins
Powerbus Planes
Propagating Noise
Single Noise-Current Source
Statistics Based Method

Disciplines

Electrical and Computer Engineering

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10.1109/EPEP.2003.1250065License: Unspecified

Statistical Approach to the EMI Modeling of Large ASICs by a SingFinal published version, 339 KBLicense: Unspecified

Cite this

@article{146f84eee43a4fef82f291459c025417,

title = "Statistical Approach to the EMI Modeling of Large ASICs by a Single Noise-Current Source",

abstract = " Large and complex ASICs are source of propagating noise inside the powerbus planes. A lumped noise source model is proposed and validated by means of a statistics based method.",

keywords = "Application Specific Integrated Circuits, Cavity-Resonator Model, EMI Modeling, Electromagnetic Interference, Fast Transient Current, Frequency Response, Integrated Circuit Modelling, Integrated Circuit Noise, Large Complex ASIC, Lumped Noise Source Model, Power Supplying Pins, Powerbus Planes, Propagating Noise, Single Noise-Current Source, Statistics Based Method",

author = "Giulio Antonini and Drewniak, \{James L.\} and Marco Leone and Antonio Orlandi and Vittorio Ricchiuti",

year = "2003",

month = oct,

day = "1",

doi = "10.1109/EPEP.2003.1250065",

language = "American English",

journal = "Proceedings of Electrical Performance of Electronic Packaging (2003, Princeton, NJ)",

}

TY - JOUR

T1 - Statistical Approach to the EMI Modeling of Large ASICs by a Single Noise-Current Source

AU - Antonini, Giulio

AU - Drewniak, James L.

AU - Leone, Marco

AU - Orlandi, Antonio

AU - Ricchiuti, Vittorio

PY - 2003/10/1

Y1 - 2003/10/1

N2 - Large and complex ASICs are source of propagating noise inside the powerbus planes. A lumped noise source model is proposed and validated by means of a statistics based method.

AB - Large and complex ASICs are source of propagating noise inside the powerbus planes. A lumped noise source model is proposed and validated by means of a statistics based method.

KW - Application Specific Integrated Circuits

KW - Cavity-Resonator Model

KW - EMI Modeling

KW - Electromagnetic Interference

KW - Fast Transient Current

KW - Frequency Response

KW - Integrated Circuit Modelling

KW - Integrated Circuit Noise

KW - Large Complex ASIC

KW - Lumped Noise Source Model

KW - Power Supplying Pins

KW - Powerbus Planes

KW - Propagating Noise

KW - Single Noise-Current Source

KW - Statistics Based Method

UR - https://scholarsmine.mst.edu/ele_comeng_facwork/1892

U2 - 10.1109/EPEP.2003.1250065

DO - 10.1109/EPEP.2003.1250065

M3 - Article

JO - Proceedings of Electrical Performance of Electronic Packaging (2003, Princeton, NJ)

JF - Proceedings of Electrical Performance of Electronic Packaging (2003, Princeton, NJ)

ER -

Statistical Approach to the EMI Modeling of Large ASICs by a Single Noise-Current Source

Abstract

Keywords

Disciplines

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