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Standby leakage power reduction technique for nanoscale CMOS VLSI systems

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Article number5438756
Pages (from-to)1127-1133
Number of pages7
JournalIEEE Transactions on Instrumentation and Measurement
Volume59
Issue number5
DOIs
StatePublished - May 2010

ASJC Scopus Subject Areas

  • Instrumentation
  • Electrical and Electronic Engineering

Keywords

  • Band-to-band tunneling (BTBT) leakage
  • Gate leakage
  • Leakage current
  • Leakage power
  • Optimal body bias voltage
  • Subthreshold leakage

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