TY - JOUR
T1 - Skin-effect loss models for time- and frequency-domain PEEC solver
AU - Ruehli, Albert E.
AU - Antonini, Giulio
AU - Jiang, Li (Lijun) Jun
PY - 2013
Y1 - 2013
KW - Modified nodal analysis (MNA)
KW - noise integrity (NI)
KW - partial element equivalent circuit (PEEC)
KW - power integrity (PI)
KW - signal integrity (SI)
KW - transmission line (TL)
UR - https://www.scopus.com/pages/publications/84872611209
UR - https://www.scopus.com/pages/publications/84872611209#tab=citedBy
U2 - 10.1109/JPROC.2012.2220312
DO - 10.1109/JPROC.2012.2220312
M3 - Article
SN - 0018-9219
VL - 101
SP - 451
EP - 472
JO - Proceedings of the IEEE
JF - Proceedings of the IEEE
IS - 2
M1 - 6353491
ER -