@article{12f4a7f4a91f4ade867e8e8493bbf232,
title = "Quality enhancement of reconfigurable multichip module systems by redundant utilization",
keywords = "Escape-tolerance, Fault-tolerance, Field-programmable-system, Interconn ection yield, Multichip-module, Quality assurance, Reconfiguration, Utilization",
author = "Minsu Choi and Nohpill Park and Fabrizio Lombardi and Vincenzo Piuri",
year = "2001",
doi = "10.1109/IMTC.2001.928813",
language = "English",
volume = "1",
pages = "204--209",
journal = "Conference Record - IEEE Instrumentation and Measurement Technology Conference",
issn = "1091-5281",
}