TY - JOUR
T1 - Processing and dielectric properties of TiO2 Thick films for high-energy density capacitor applications
AU - Chao, Sheng
AU - Dogan, Fatih
PY - 2011/11
Y1 - 2011/11
UR - https://www.scopus.com/pages/publications/80755169407
UR - https://www.scopus.com/pages/publications/80755169407#tab=citedBy
U2 - 10.1111/j.1744-7402.2010.02592.x
DO - 10.1111/j.1744-7402.2010.02592.x
M3 - Article
SN - 1546-542X
VL - 8
SP - 1363
EP - 1373
JO - International Journal of Applied Ceramic Technology
JF - International Journal of Applied Ceramic Technology
IS - 6
ER -