Abstract
<p> As the data rate and density of digital high-speed systems are getting higher, far-end crosstalk (FEXT) noise becomes one of the major issues that limit signal integrity performance. It was commonly believed that FEXT would be eliminated for strip lines routed in a homogeneous dielectric, but in reality, FEXT can always be measured in strip lines on the fabricated printed circuit boards. A slightly different dielectric permittivity (ϵr) of prepreg and core may be one of the major contributors to the FEXT. This article is focusing on providing a practical FEXT modeling methodology for strip lines by introducing an approach to extract ϵr of prepreg and core. Using the known cross-sectional geometry and measured S-parameters of the coupled strip line, the capacitance components in prepreg and core are separated using a two-dimensional solver, and the ϵr of prepreg and core is determined. A more comprehensive FEXT modeling approach is proposed by applying extracted inhomogeneous dielectric material information.</p>
| Original language | American English |
|---|---|
| Pages (from-to) | 209-218 |
| Number of pages | 10 |
| Journal | IEEE Transactions on Electromagnetic Compatibility |
| Volume | 64 |
| Issue number | 1 |
| DOIs | |
| State | Published - Jun 10 2021 |
Keywords
- Capacitance
- Conductors
- Dielectric Material
- Dielectric Materials
- Dielectrics
- Far-End Crosstalk (FEXT)
- Nonhomogeneous Media
- Permittivity Measurement
- Stripline
- Transmission-Line Theory
Disciplines
- Electrical and Computer Engineering
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