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Parallel approach to identifying the well-test interpretation model using a neurocomputer

  • Missouri University of Science and Technology

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsSteven K. Rogers, Dennis W. Ruck
Pages646-656
Number of pages11
StatePublished - 1996
EventApplications and Science of Artificial Neural Networks II - Orlando, FL, USA
Duration: Apr 9 1996Apr 12 1996

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume2760
ISSN (Print)0277-786X

Conference

ConferenceApplications and Science of Artificial Neural Networks II
CityOrlando, FL, USA
Period4/9/964/12/96

ASJC Scopus Subject Areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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