Optimized built-in self-test technique for CAEN-based nanofabric systems

Sambhav Kundaikar; MacIej Zawodniok

doi:10.1109/NANO.2011.6144624

Optimized built-in self-test technique for CAEN-based nanofabric systems

Sambhav Kundaikar
, MacIej Zawodniok

Electrical and Computer Engineering

Missouri University of Science and Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	2011 11th IEEE International Conference on Nanotechnology, NANO 2011
Pages	1717-1722
Number of pages	6
DOIs	https://doi.org/10.1109/NANO.2011.6144624
State	Published - 2011
Event	2011 11th IEEE International Conference on Nanotechnology, NANO 2011 - Portland, OR, United States Duration: Aug 15 2011 → Aug 19 2011

Publication series

Name	Proceedings of the IEEE Conference on Nanotechnology
ISSN (Print)	1944-9399
ISSN (Electronic)	1944-9380

Conference

Conference	2011 11th IEEE International Conference on Nanotechnology, NANO 2011
Country/Territory	United States
City	Portland, OR
Period	8/15/11 → 8/19/11

ASJC Scopus Subject Areas

Bioengineering
Electrical and Electronic Engineering
Materials Chemistry
Condensed Matter Physics

Keywords

BIST
CAEN
defect tolerance
nanofabric
nanowire

Access to Document

10.1109/NANO.2011.6144624

Cite this

Kundaikar, S & Zawodniok, M 2011, Optimized built-in self-test technique for CAEN-based nanofabric systems. in 2011 11th IEEE International Conference on Nanotechnology, NANO 2011., 6144624, Proceedings of the IEEE Conference on Nanotechnology, pp. 1717-1722, 2011 11th IEEE International Conference on Nanotechnology, NANO 2011, Portland, OR, United States, 8/15/11. https://doi.org/10.1109/NANO.2011.6144624

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title = "Optimized built-in self-test technique for CAEN-based nanofabric systems",

keywords = "BIST, CAEN, defect tolerance, nanofabric, nanowire",

author = "Sambhav Kundaikar and MacIej Zawodniok",

year = "2011",

doi = "10.1109/NANO.2011.6144624",

language = "English",

isbn = "9781457715143",

series = "Proceedings of the IEEE Conference on Nanotechnology",

pages = "1717--1722",

booktitle = "2011 11th IEEE International Conference on Nanotechnology, NANO 2011",

note = "2011 11th IEEE International Conference on Nanotechnology, NANO 2011 ; Conference date: 15-08-2011 Through 19-08-2011",

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T1 - Optimized built-in self-test technique for CAEN-based nanofabric systems

AU - Kundaikar, Sambhav

AU - Zawodniok, MacIej

PY - 2011

Y1 - 2011

KW - BIST

KW - CAEN

KW - defect tolerance

KW - nanofabric

KW - nanowire

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UR - https://www.scopus.com/pages/publications/84858963802#tab=citedBy

U2 - 10.1109/NANO.2011.6144624

DO - 10.1109/NANO.2011.6144624

M3 - Conference contribution

AN - SCOPUS:84858963802

SN - 9781457715143

T3 - Proceedings of the IEEE Conference on Nanotechnology

SP - 1717

EP - 1722

BT - 2011 11th IEEE International Conference on Nanotechnology, NANO 2011

T2 - 2011 11th IEEE International Conference on Nanotechnology, NANO 2011

Y2 - 15 August 2011 through 19 August 2011

ER -

Optimized built-in self-test technique for CAEN-based nanofabric systems

Publication series

Conference

ASJC Scopus Subject Areas

Keywords

Access to Document

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