Occupation dynamics of trap states in an a-Si:H thin-film transistor

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@article{ffa8dd018a9442d48875bd868cb87b46,

title = "Occupation dynamics of trap states in an a-Si:H thin-film transistor",

author = "Bullock, \{J. N.\} and Cheng-Hsiao Wu",

year = "1991",

doi = "10.1063/1.347420",

language = "English",

volume = "69",

pages = "1041--1046",

journal = "Journal of Applied Physics",

issn = "0021-8979",

number = "2",

}

TY - JOUR

T1 - Occupation dynamics of trap states in an a-Si:H thin-film transistor

AU - Bullock, J. N.

AU - Wu, Cheng-Hsiao

PY - 1991

Y1 - 1991

UR - https://www.scopus.com/pages/publications/3943078243

UR - https://www.scopus.com/pages/publications/3943078243#tab=citedBy

U2 - 10.1063/1.347420

DO - 10.1063/1.347420

M3 - Article

SN - 0021-8979

VL - 69

SP - 1041

EP - 1046

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 2

ER -