@inproceedings{dff41e172bc84dd29fd42600cfc185de,
title = "Nonlinearity of digital I/Os and its behaviour modeling",
keywords = "ANN, EMC, High-Speed Driver, Nonlinearity, Parametric Model",
author = "Yao, \{He Ming\} and Zhang, \{Huan Huan\} and Yu, \{Hui Chun\} and Luo, \{Xing Yun\} and Bin Li and Ren, \{Hua Sheng\} and Jiang, \{Li Jun\}",
note = "Publisher Copyright: {\textcopyright} 2015 IEEE.; IEEE Electrical Design of Advanced Packaging and Systems Symposium, IEEE EDAPS 2015 ; Conference date: 14-12-2015 Through 16-12-2015",
year = "2016",
month = jan,
day = "14",
doi = "10.1109/EDAPS.2015.7383702",
language = "English",
series = "2015 IEEE Electrical Design of Advanced Packaging and Systems Symposium, IEEE EDAPS 2015",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "35--38",
booktitle = "2015 IEEE Electrical Design of Advanced Packaging and Systems Symposium, IEEE EDAPS 2015",
}