Near Field Scanning-Based EMI Radiation Root Cause Analysis in an SSD

Xiangrui Su; Wenchang Huang; Junghee Cho; Joonki Paek; Chulsoon Hwang

doi:10.1109/EMCSIPI50001.2023.10241665

Near Field Scanning-Based EMI Radiation Root Cause Analysis in an SSD

Xiangrui Su
, Wenchang Huang
, Junghee Cho
, Joonki Paek
, Chulsoon Hwang

Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

In Modern Portable Electronic Devices, Solid-State Drives (SSDs) Are Commonly Used and Have Been Identified as One of the Dominant Electromagnetic Interference (EMI) Noise Sources that Can Cause RF Desensitization Issues. in This Paper, the EM Emission Source from an SSD Module is Identified and Analyzed using Near Field Scanning and Dipole Moment Source Reconstruction. the Identified Noise Current Path Including the Power Management Integrated Circuit and the Decoupling Capacitor is Validated with the Assistance of Full-Wave Simulation. the Measured Noise Voltage is Used as an Excitation in the Simulation and the Simulated Near Fields Showed a Good Correlation with Measured Near Fields in Both Pattern and Magnitude. based on the Validated Radiation Mechanism, an Optimized Layout is Proposed and Validated in Simulation Reducing the Far Field Radiation by 10 DB.

Original language	American English
Journal	2023 IEEE Symposium on Electromagnetic Compatibility and Signal/Power Integrity, EMC+SIPI 2023
DOIs	https://doi.org/10.1109/EMCSIPI50001.2023.10241665
State	Published - Jan 1 2023

Keywords

EMI
SSD
near field scan
radiation mechanism

Disciplines

Electrical and Computer Engineering

Access to Document

10.1109/EMCSIPI50001.2023.10241665License: Unspecified

Near Field Scanning-Based EMI Radiation Root Cause Analysis in anFinal published version, 979 KBLicense: Unspecified

Cite this

@article{aed7ae26a56147de8ec4028d4e9045c3,

title = "Near Field Scanning-Based EMI Radiation Root Cause Analysis in an SSD",

abstract = " In Modern Portable Electronic Devices, Solid-State Drives (SSDs) Are Commonly Used and Have Been Identified as One of the Dominant Electromagnetic Interference (EMI) Noise Sources that Can Cause RF Desensitization Issues. in This Paper, the EM Emission Source from an SSD Module is Identified and Analyzed using Near Field Scanning and Dipole Moment Source Reconstruction. the Identified Noise Current Path Including the Power Management Integrated Circuit and the Decoupling Capacitor is Validated with the Assistance of Full-Wave Simulation. the Measured Noise Voltage is Used as an Excitation in the Simulation and the Simulated Near Fields Showed a Good Correlation with Measured Near Fields in Both Pattern and Magnitude. based on the Validated Radiation Mechanism, an Optimized Layout is Proposed and Validated in Simulation Reducing the Far Field Radiation by 10 DB.",

keywords = "EMI, SSD, near field scan, radiation mechanism",

author = "Xiangrui Su and Wenchang Huang and Junghee Cho and Joonki Paek and Chulsoon Hwang",

year = "2023",

month = jan,

day = "1",

doi = "10.1109/EMCSIPI50001.2023.10241665",

language = "American English",

journal = "2023 IEEE Symposium on Electromagnetic Compatibility and Signal/Power Integrity, EMC+SIPI 2023",

}

TY - JOUR

T1 - Near Field Scanning-Based EMI Radiation Root Cause Analysis in an SSD

AU - Su, Xiangrui

AU - Huang, Wenchang

AU - Cho, Junghee

AU - Paek, Joonki

AU - Hwang, Chulsoon

PY - 2023/1/1

Y1 - 2023/1/1

N2 - In Modern Portable Electronic Devices, Solid-State Drives (SSDs) Are Commonly Used and Have Been Identified as One of the Dominant Electromagnetic Interference (EMI) Noise Sources that Can Cause RF Desensitization Issues. in This Paper, the EM Emission Source from an SSD Module is Identified and Analyzed using Near Field Scanning and Dipole Moment Source Reconstruction. the Identified Noise Current Path Including the Power Management Integrated Circuit and the Decoupling Capacitor is Validated with the Assistance of Full-Wave Simulation. the Measured Noise Voltage is Used as an Excitation in the Simulation and the Simulated Near Fields Showed a Good Correlation with Measured Near Fields in Both Pattern and Magnitude. based on the Validated Radiation Mechanism, an Optimized Layout is Proposed and Validated in Simulation Reducing the Far Field Radiation by 10 DB.

AB - In Modern Portable Electronic Devices, Solid-State Drives (SSDs) Are Commonly Used and Have Been Identified as One of the Dominant Electromagnetic Interference (EMI) Noise Sources that Can Cause RF Desensitization Issues. in This Paper, the EM Emission Source from an SSD Module is Identified and Analyzed using Near Field Scanning and Dipole Moment Source Reconstruction. the Identified Noise Current Path Including the Power Management Integrated Circuit and the Decoupling Capacitor is Validated with the Assistance of Full-Wave Simulation. the Measured Noise Voltage is Used as an Excitation in the Simulation and the Simulated Near Fields Showed a Good Correlation with Measured Near Fields in Both Pattern and Magnitude. based on the Validated Radiation Mechanism, an Optimized Layout is Proposed and Validated in Simulation Reducing the Far Field Radiation by 10 DB.

KW - EMI

KW - SSD

KW - near field scan

KW - radiation mechanism

UR - https://scholarsmine.mst.edu/ele_comeng_facwork/5155

U2 - 10.1109/EMCSIPI50001.2023.10241665

DO - 10.1109/EMCSIPI50001.2023.10241665

M3 - Article

JO - 2023 IEEE Symposium on Electromagnetic Compatibility and Signal/Power Integrity, EMC+SIPI 2023

JF - 2023 IEEE Symposium on Electromagnetic Compatibility and Signal/Power Integrity, EMC+SIPI 2023

ER -

Near Field Scanning-Based EMI Radiation Root Cause Analysis in an SSD

Abstract

Keywords

Disciplines

Access to Document

Other files and links

Fingerprint

Cite this