Skip to main navigation Skip to search Skip to main content

Nanomanipulation Using Atomic Force Microscope with Drift Compensation

Research output: Contribution to journal › Article › peer-review

Abstract

This paper proposes an atomic force microscope (AFM) based force controller to push nanoparticles on the substrates since it is tedious for human. A block phase correlation-based algorithm is embedded into the controller for compensating the thermal drift during nanomanipulation. Further, a neural network (NN) is employed to approximate the unknown nanoparticle and substrate contact dynamics including the roughness effects. Using the NN-based adaptive force controller the task of pushing nanoparticles is demonstrated. Finally, using the Lyapunov-based stability analysis, the uniform ultimately boundedness (UUB) of the closed-loop signals is demonstrated

Original languageAmerican English
JournalProceedings of the American Control Conference, 2006
DOIs
StatePublished - Jun 1 2006

Keywords

  • Adaptive Control
  • Atomic Force Microscopy
  • Closed Loop Systems
  • Compensation
  • Control System Analysis
  • Force Control
  • Lyapunov Methods
  • Manipulators
  • Neurocontrollers
  • Stability
  • Substrates

Disciplines

  • Computer Sciences
  • Electrical and Computer Engineering

Fingerprint

Dive into the research topics of 'Nanomanipulation Using Atomic Force Microscope with Drift Compensation'. Together they form a unique fingerprint.

Cite this