@article{07af068ebfd94caaa9f3a9fcd08911f2,
title = "Modeling and Analysis of Soft-Test/Repair for CCD-Based Digital X-Ray Systems",
keywords = "Charge coupled device (CCD), Defective pixels, Diagnostic confidence, Digital X-ray, Repair, Telediagnosis, Teleradiology, Testing, Virtual yield, Yield",
author = "Byoungjae Jin and Nohpill Park and George, \{Koshy M.\} and Minsu Choi and Yeary, \{Mark B.\}",
year = "2003",
month = dec,
doi = "10.1109/TIM.2003.818735",
language = "English",
volume = "52",
pages = "1713--1721",
journal = "IEEE Transactions on Instrumentation and Measurement",
issn = "0018-9456",
number = "6",
}