Method of Effective Roughness Dielectric in a PCB: Measurement and Full-Wave Simulation Verification

Marina Koledintseva; Tracey Vincent; Antonio Ciccomancini Scogna; Scott Hinaga

doi:10.1109/TEMC.2015.2412113

Method of Effective Roughness Dielectric in a PCB: Measurement and Full-Wave Simulation Verification

Marina Koledintseva
, Tracey Vincent
, Antonio Ciccomancini Scogna
, Scott Hinaga

Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

Original language	English
Article number	7086038
Pages (from-to)	807-814
Number of pages	8
Journal	IEEE Transactions on Electromagnetic Compatibility
Volume	57
Issue number	4
DOIs	https://doi.org/10.1109/TEMC.2015.2412113
State	Published - Aug 1 2015

ASJC Scopus Subject Areas

Atomic and Molecular Physics, and Optics
Condensed Matter Physics
Electrical and Electronic Engineering

Keywords

Dielectric measurements
numerical analysis
printed circuit fabrication
rough surfaces
stripline

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10.1109/TEMC.2015.2412113

Cite this

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title = "Method of Effective Roughness Dielectric in a PCB: Measurement and Full-Wave Simulation Verification",

keywords = "Dielectric measurements, numerical analysis, printed circuit fabrication, rough surfaces, stripline",

author = "Marina Koledintseva and Tracey Vincent and Scogna, \{Antonio Ciccomancini\} and Scott Hinaga",

note = "Publisher Copyright: {\textcopyright} 2015 IEEE.",

year = "2015",

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doi = "10.1109/TEMC.2015.2412113",

language = "English",

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T2 - Measurement and Full-Wave Simulation Verification

AU - Koledintseva, Marina

AU - Vincent, Tracey

AU - Scogna, Antonio Ciccomancini

AU - Hinaga, Scott

PY - 2015/8/1

Y1 - 2015/8/1

KW - Dielectric measurements

KW - numerical analysis

KW - printed circuit fabrication

KW - rough surfaces

KW - stripline

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UR - https://www.scopus.com/pages/publications/85027931337#tab=citedBy

U2 - 10.1109/TEMC.2015.2412113

DO - 10.1109/TEMC.2015.2412113

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JO - IEEE Transactions on Electromagnetic Compatibility

JF - IEEE Transactions on Electromagnetic Compatibility

IS - 4

M1 - 7086038

ER -

Method of Effective Roughness Dielectric in a PCB: Measurement and Full-Wave Simulation Verification

ASJC Scopus Subject Areas

Keywords

Access to Document

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