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MD-ELM: Originally Mislabeled Samples Detection using OP-ELM Model

  • Anton Akusok
  • , David Veganzones
  • , Yoan Miche
  • , Kaj Mikael Björk
  • , Philippe du Jardin
  • , Eric Severin
  • , Amaury Lendasse
  • University of Iowa
  • Université de Lille
  • Aalto University
  • Nokia-Siemens Networks
  • Arcada University of Applied Sciences
  • EDHEC Business School

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)242-250
Number of pages9
JournalNeurocomputing
Volume159
Issue number1
DOIs
StatePublished - 2015
Externally publishedYes

ASJC Scopus Subject Areas

  • Computer Science Applications
  • Cognitive Neuroscience
  • Artificial Intelligence

Keywords

  • Classification
  • Extreme learning machine
  • Mislabels

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