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Laser-Induced Failure in Biased Silicon avalanche photodiodes

  • University of Texas at Austin

Research output: Contribution to journalConference articlepeer-review

Original languageEnglish
Article number14380L
Pages (from-to)220-229
Number of pages10
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume1438
DOIs
StatePublished - Nov 1 1990
Externally publishedYes
Event21st Symposium on Optical Materials for High-Power Lasers 1989 - Boulder, United States
Duration: Nov 1 1989Nov 3 1989

ASJC Scopus Subject Areas

  • Electronic, Optical and Magnetic Materials
  • Instrumentation
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Keywords

  • And Silicon Photodiodes
  • Avalanche Photodiodes
  • Electrical Degradation
  • Laser Damage

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