Investigation of 12 μm 4H-SiC epilayers for radiation detection and noise analysis of front-end readout electronics

Khai V. Nguyen; Rahmi O. Pak; Cihan Oner; Feng Zhao; Krishna C. Mandal

doi:10.1109/NSSMIC.2015.7582285

Investigation of 12 μm 4H-SiC epilayers for radiation detection and noise analysis of front-end readout electronics

Khai V. Nguyen
, Rahmi O. Pak
, Cihan Oner
, Feng Zhao
, Krishna C. Mandal

University of South Carolina
Washington State University Vancouver

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	2015 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2015
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781467398626
DOIs	https://doi.org/10.1109/NSSMIC.2015.7582285
State	Published - Oct 3 2016
Externally published	Yes
Event	2015 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2015 - San Diego, United States Duration: Oct 31 2015 → Nov 7 2015

Publication series

Name	2015 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2015

Conference

Conference	2015 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2015
Country/Territory	United States
City	San Diego
Period	10/31/15 → 11/7/15

ASJC Scopus Subject Areas

Nuclear and High Energy Physics
Radiology Nuclear Medicine and imaging
Instrumentation

Access to Document

10.1109/NSSMIC.2015.7582285

Cite this

Nguyen, K. V., Pak, R. O., Oner, C., Zhao, F., & Mandal, K. C. (2016). Investigation of 12 μm 4H-SiC epilayers for radiation detection and noise analysis of front-end readout electronics. In 2015 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2015 Article 7582285 (2015 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2015). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/NSSMIC.2015.7582285

Investigation of 12 μm 4H-SiC epilayers for radiation detection and noise analysis of front-end readout electronics. / Nguyen, Khai V.; Pak, Rahmi O.; Oner, Cihan et al.
2015 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2015. Institute of Electrical and Electronics Engineers Inc., 2016. 7582285 (2015 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2015).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Nguyen, KV, Pak, RO, Oner, C, Zhao, F & Mandal, KC 2016, Investigation of 12 μm 4H-SiC epilayers for radiation detection and noise analysis of front-end readout electronics. in 2015 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2015., 7582285, 2015 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2015, Institute of Electrical and Electronics Engineers Inc., 2015 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2015, San Diego, United States, 10/31/15. https://doi.org/10.1109/NSSMIC.2015.7582285

Nguyen KV, Pak RO, Oner C, Zhao F, Mandal KC. Investigation of 12 μm 4H-SiC epilayers for radiation detection and noise analysis of front-end readout electronics. In 2015 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2015. Institute of Electrical and Electronics Engineers Inc. 2016. 7582285. (2015 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2015). doi: 10.1109/NSSMIC.2015.7582285

Nguyen, Khai V. ; Pak, Rahmi O. ; Oner, Cihan et al. / Investigation of 12 μm 4H-SiC epilayers for radiation detection and noise analysis of front-end readout electronics. 2015 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2015. Institute of Electrical and Electronics Engineers Inc., 2016. (2015 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2015).

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title = "Investigation of 12 μm 4H-SiC epilayers for radiation detection and noise analysis of front-end readout electronics",

author = "Nguyen, \{Khai V.\} and Pak, \{Rahmi O.\} and Cihan Oner and Feng Zhao and Mandal, \{Krishna C.\}",

note = "Publisher Copyright: {\textcopyright} 2015 IEEE.; 2015 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2015 ; Conference date: 31-10-2015 Through 07-11-2015",

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doi = "10.1109/NSSMIC.2015.7582285",

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AU - Pak, Rahmi O.

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AU - Zhao, Feng

AU - Mandal, Krishna C.

PY - 2016/10/3

Y1 - 2016/10/3

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BT - 2015 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2015

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2015 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2015

Y2 - 31 October 2015 through 7 November 2015

ER -

Investigation of 12 μm 4H-SiC epilayers for radiation detection and noise analysis of front-end readout electronics

Publication series

Conference

ASJC Scopus Subject Areas

Access to Document

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