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Influence of phosphorus content on the interfacial microstructure between Sn-3.5Ag solder and electroless Ni-P metallization on Cu substrate

  • Agency for Science, Technology and Research, Singapore
  • Nanyang Technological University

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)68-72
Number of pages5
JournalIEEE Transactions on Advanced Packaging
Volume30
Issue number1
DOIs
StatePublished - Feb 2007
Externally publishedYes

ASJC Scopus Subject Areas

  • Electrical and Electronic Engineering

Keywords

  • Electroless nickel
  • Interfacial reaction
  • Intermetallic spallation
  • Phosphorous content
  • Solder
  • Under bump metallization

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