In-situ scanning electron microscope chemical vapor deposition as a platform for nanomanufacturing insights

Gordon Koerner; Ramakrishna Surya; Kannappan Palaniappan; Prasad Calyam; Filiz Bunyak; Matthew R. Maschmann

doi:10.1115/IMECE2021-73554

In-situ scanning electron microscope chemical vapor deposition as a platform for nanomanufacturing insights

Gordon Koerner
, Ramakrishna Surya
, Kannappan Palaniappan
, Prasad Calyam
, Filiz Bunyak
, Matthew R. Maschmann

University of Missouri-Columbia
University of Missouri

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	Advanced Manufacturing
Publisher	American Society of Mechanical Engineers (ASME)
ISBN (Electronic)	9780791885567
DOIs	https://doi.org/10.1115/IMECE2021-73554
State	Published - 2021
Externally published	Yes
Event	ASME 2021 International Mechanical Engineering Congress and Exposition, IMECE 2021 - Virtual, Online Duration: Nov 1 2021 → Nov 5 2021

Publication series

Name	ASME International Mechanical Engineering Congress and Exposition, Proceedings (IMECE)
Volume	2B-2021

Conference

Conference	ASME 2021 International Mechanical Engineering Congress and Exposition, IMECE 2021
City	Virtual, Online
Period	11/1/21 → 11/5/21

ASJC Scopus Subject Areas

Mechanical Engineering

Keywords

Carbon nanotubes
In-situ
Scanning electron microscope
Synthesis

Access to Document

10.1115/IMECE2021-73554

Cite this

Koerner, G., Surya, R., Palaniappan, K., Calyam, P., Bunyak, F., & Maschmann, M. R. (2021). In-situ scanning electron microscope chemical vapor deposition as a platform for nanomanufacturing insights. In Advanced Manufacturing Article V02BT02A052 (ASME International Mechanical Engineering Congress and Exposition, Proceedings (IMECE); Vol. 2B-2021). American Society of Mechanical Engineers (ASME). https://doi.org/10.1115/IMECE2021-73554

In-situ scanning electron microscope chemical vapor deposition as a platform for nanomanufacturing insights. / Koerner, Gordon; Surya, Ramakrishna; Palaniappan, Kannappan et al.
Advanced Manufacturing. American Society of Mechanical Engineers (ASME), 2021. V02BT02A052 (ASME International Mechanical Engineering Congress and Exposition, Proceedings (IMECE); Vol. 2B-2021).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Koerner, G, Surya, R, Palaniappan, K, Calyam, P, Bunyak, F & Maschmann, MR 2021, In-situ scanning electron microscope chemical vapor deposition as a platform for nanomanufacturing insights. in Advanced Manufacturing., V02BT02A052, ASME International Mechanical Engineering Congress and Exposition, Proceedings (IMECE), vol. 2B-2021, American Society of Mechanical Engineers (ASME), ASME 2021 International Mechanical Engineering Congress and Exposition, IMECE 2021, Virtual, Online, 11/1/21. https://doi.org/10.1115/IMECE2021-73554

Koerner G, Surya R, Palaniappan K, Calyam P, Bunyak F, Maschmann MR. In-situ scanning electron microscope chemical vapor deposition as a platform for nanomanufacturing insights. In Advanced Manufacturing. American Society of Mechanical Engineers (ASME). 2021. V02BT02A052. (ASME International Mechanical Engineering Congress and Exposition, Proceedings (IMECE)). doi: 10.1115/IMECE2021-73554

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title = "In-situ scanning electron microscope chemical vapor deposition as a platform for nanomanufacturing insights",

keywords = "Carbon nanotubes, In-situ, Scanning electron microscope, Synthesis",

author = "Gordon Koerner and Ramakrishna Surya and Kannappan Palaniappan and Prasad Calyam and Filiz Bunyak and Maschmann, \{Matthew R.\}",

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AU - Bunyak, Filiz

AU - Maschmann, Matthew R.

PY - 2021

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KW - In-situ

KW - Scanning electron microscope

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T3 - ASME International Mechanical Engineering Congress and Exposition, Proceedings (IMECE)

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Y2 - 1 November 2021 through 5 November 2021

ER -

In-situ scanning electron microscope chemical vapor deposition as a platform for nanomanufacturing insights

Publication series

Conference

ASJC Scopus Subject Areas

Keywords

Access to Document

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Cite this