In-process layer surface inspection of SLA products

W. S. Park; M. Y. Kim; H. G. Lee; H. S. Cho; Ming-Chuan Leu

doi:10.1117/12.326910

In-process layer surface inspection of SLA products

W. S. Park
, M. Y. Kim
, H. G. Lee
, H. S. Cho
, Ming-Chuan Leu

Mechanical and Aerospace Engineering

Research output: Contribution to journal › Conference article › peer-review

Original language	English
Pages (from-to)	70-78
Number of pages	9
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	3517
DOIs	https://doi.org/10.1117/12.326910
State	Published - 1998
Event	Intelligent Systems in Design and Manufacturing - Boston, MA, United States Duration: Nov 2 1998 → Nov 4 1998

ASJC Scopus Subject Areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

Keywords

Cross-sectional image
Epoxy resin
Process monitoring
Stereolithography

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10.1117/12.326910

Cite this

@article{bd00d057a779406983f4d553631939a1,

title = "In-process layer surface inspection of SLA products",

keywords = "Cross-sectional image, Epoxy resin, Process monitoring, Stereolithography",

author = "Park, \{W. S.\} and Kim, \{M. Y.\} and Lee, \{H. G.\} and Cho, \{H. S.\} and Ming-Chuan Leu",

year = "1998",

doi = "10.1117/12.326910",

language = "English",

volume = "3517",

pages = "70--78",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

note = "Intelligent Systems in Design and Manufacturing ; Conference date: 02-11-1998 Through 04-11-1998",

}

TY - JOUR

T1 - In-process layer surface inspection of SLA products

AU - Park, W. S.

AU - Kim, M. Y.

AU - Lee, H. G.

AU - Cho, H. S.

AU - Leu, Ming-Chuan

PY - 1998

Y1 - 1998

KW - Cross-sectional image

KW - Epoxy resin

KW - Process monitoring

KW - Stereolithography

UR - https://www.scopus.com/pages/publications/0032225233

UR - https://www.scopus.com/pages/publications/0032225233#tab=citedBy

U2 - 10.1117/12.326910

DO - 10.1117/12.326910

M3 - Conference article

SN - 0277-786X

VL - 3517

SP - 70

EP - 78

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Intelligent Systems in Design and Manufacturing

Y2 - 2 November 1998 through 4 November 1998

ER -

In-process layer surface inspection of SLA products

ASJC Scopus Subject Areas

Keywords

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