Improved target impedance and IC transient current measurement for power distribution network design

Jingook Kim; Songping Wu; Hanfeng Wang; Yuzou Takita; Hayato Takeuchi; Kenji Araki; Gang Feng; Jun Fan

doi:10.1109/ISEMC.2010.5711316

Improved target impedance and IC transient current measurement for power distribution network design

Jingook Kim
, Songping Wu
, Hanfeng Wang
, Yuzou Takita
, Hayato Takeuchi
, Kenji Araki
, Gang Feng
, Jun Fan

Electrical and Computer Engineering

Missouri University of Science and Technology
Sony Group Corporation
Research in Motion Limited

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	IEEE International Symposium on Electromagnetic Compatibility, EMC 2010 - Final Program
Pages	445-450
Number of pages	6
DOIs	https://doi.org/10.1109/ISEMC.2010.5711316
State	Published - 2010
Event	2010 IEEE International Symposium on Electromagnetic Compatibility, EMC 2010 - Fort Lauderdale, FL, United States Duration: Jul 25 2010 → Jul 30 2010

Publication series

Name	IEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)	1077-4076

Conference

Conference	2010 IEEE International Symposium on Electromagnetic Compatibility, EMC 2010
Country/Territory	United States
City	Fort Lauderdale, FL
Period	7/25/10 → 7/30/10

ASJC Scopus Subject Areas

Condensed Matter Physics
Electrical and Electronic Engineering

Access to Document

10.1109/ISEMC.2010.5711316

Cite this

Kim, J., Wu, S., Wang, H., Takita, Y., Takeuchi, H., Araki, K., Feng, G., & Fan, J. (2010). Improved target impedance and IC transient current measurement for power distribution network design. In IEEE International Symposium on Electromagnetic Compatibility, EMC 2010 - Final Program (pp. 445-450). Article 5711316 (IEEE International Symposium on Electromagnetic Compatibility). https://doi.org/10.1109/ISEMC.2010.5711316

Improved target impedance and IC transient current measurement for power distribution network design. / Kim, Jingook; Wu, Songping; Wang, Hanfeng et al.
IEEE International Symposium on Electromagnetic Compatibility, EMC 2010 - Final Program. 2010. p. 445-450 5711316 (IEEE International Symposium on Electromagnetic Compatibility).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Kim, J, Wu, S, Wang, H, Takita, Y, Takeuchi, H, Araki, K, Feng, G & Fan, J 2010, Improved target impedance and IC transient current measurement for power distribution network design. in IEEE International Symposium on Electromagnetic Compatibility, EMC 2010 - Final Program., 5711316, IEEE International Symposium on Electromagnetic Compatibility, pp. 445-450, 2010 IEEE International Symposium on Electromagnetic Compatibility, EMC 2010, Fort Lauderdale, FL, United States, 7/25/10. https://doi.org/10.1109/ISEMC.2010.5711316

Kim J, Wu S, Wang H, Takita Y, Takeuchi H, Araki K et al. Improved target impedance and IC transient current measurement for power distribution network design. In IEEE International Symposium on Electromagnetic Compatibility, EMC 2010 - Final Program. 2010. p. 445-450. 5711316. (IEEE International Symposium on Electromagnetic Compatibility). doi: 10.1109/ISEMC.2010.5711316

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author = "Jingook Kim and Songping Wu and Hanfeng Wang and Yuzou Takita and Hayato Takeuchi and Kenji Araki and Gang Feng and Jun Fan",

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AU - Feng, Gang

AU - Fan, Jun

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Improved target impedance and IC transient current measurement for power distribution network design

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ASJC Scopus Subject Areas

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