TY - GEN
T1 - Fullwave simulation and validation of a complex packaging structure
AU - Archambeault, B.
AU - Connor, S.
AU - De Araujo, Daniel N.
AU - Ruehli, A.
AU - Schuster, C.
PY - 2006
Y1 - 2006
UR - https://www.scopus.com/pages/publications/33845567088
UR - https://www.scopus.com/pages/publications/33845567088#tab=citedBy
U2 - 10.1109/ECTC.2006.1645816
DO - 10.1109/ECTC.2006.1645816
M3 - Conference contribution
AN - SCOPUS:33845567088
SN - 1424401526
SN - 9781424401529
T3 - Proceedings - Electronic Components and Technology Conference
SP - 1268
EP - 1273
BT - Proceedings - IEEE 56th Electronic Components and Technology Conference
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - IEEE 56th Electronic Components and Technology Conference
Y2 - 30 May 2006 through 2 June 2006
ER -