Fluorescence Yield Near Edge X-ray Absorption Fine Structure above the carbon K edge: A new method for characterizing adsorbed intermediates and surface reaction rates in the presence of reactive environments

John L. Gland; Francisco Zaera; Daniel A. Fischer; Shikong Shen

doi:10.1016/S0167-2991(09)60711-4

Fluorescence Yield Near Edge X-ray Absorption Fine Structure above the carbon K edge: A new method for characterizing adsorbed intermediates and surface reaction rates in the presence of reactive environments

John L. Gland
, Francisco Zaera
, Daniel A. Fischer
, Shikong Shen

ExxonMobil
University of California at Riverside
Brookhaven National Laboratory
Chinese Academy of Sciences

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	835-843
Number of pages	9
Journal	Studies in Surface Science and Catalysis
Volume	38
Issue number	C
DOIs	https://doi.org/10.1016/S0167-2991(09)60711-4
State	Published - 1988
Externally published	Yes

ASJC Scopus Subject Areas

Catalysis
Condensed Matter Physics
Physical and Theoretical Chemistry
Surfaces, Coatings and Films
Materials Chemistry

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10.1016/S0167-2991(09)60711-4

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Gland, J. L., Zaera, F., Fischer, D. A., & Shen, S. (1988). Fluorescence Yield Near Edge X-ray Absorption Fine Structure above the carbon K edge: A new method for characterizing adsorbed intermediates and surface reaction rates in the presence of reactive environments. Studies in Surface Science and Catalysis, 38(C), 835-843. https://doi.org/10.1016/S0167-2991(09)60711-4

Fluorescence Yield Near Edge X-ray Absorption Fine Structure above the carbon K edge: A new method for characterizing adsorbed intermediates and surface reaction rates in the presence of reactive environments. / Gland, John L.; Zaera, Francisco; Fischer, Daniel A. et al.
In: Studies in Surface Science and Catalysis, Vol. 38, No. C, 1988, p. 835-843.

Research output: Contribution to journal › Article › peer-review

Gland, JL, Zaera, F, Fischer, DA & Shen, S 1988, 'Fluorescence Yield Near Edge X-ray Absorption Fine Structure above the carbon K edge: A new method for characterizing adsorbed intermediates and surface reaction rates in the presence of reactive environments', Studies in Surface Science and Catalysis, vol. 38, no. C, pp. 835-843. https://doi.org/10.1016/S0167-2991(09)60711-4

@article{96fc8bd56468435485175fc339e83287,

title = "Fluorescence Yield Near Edge X-ray Absorption Fine Structure above the carbon K edge: A new method for characterizing adsorbed intermediates and surface reaction rates in the presence of reactive environments",

author = "Gland, \{John L.\} and Francisco Zaera and Fischer, \{Daniel A.\} and Shikong Shen",

year = "1988",

doi = "10.1016/S0167-2991(09)60711-4",

language = "English",

volume = "38",

pages = "835--843",

journal = "Studies in Surface Science and Catalysis",

issn = "0167-2991",

number = "C",

}

TY - JOUR

T1 - Fluorescence Yield Near Edge X-ray Absorption Fine Structure above the carbon K edge

T2 - A new method for characterizing adsorbed intermediates and surface reaction rates in the presence of reactive environments

AU - Gland, John L.

AU - Zaera, Francisco

AU - Fischer, Daniel A.

AU - Shen, Shikong

PY - 1988

Y1 - 1988

UR - https://www.scopus.com/pages/publications/34447617975

UR - https://www.scopus.com/pages/publications/34447617975#tab=citedBy

U2 - 10.1016/S0167-2991(09)60711-4

DO - 10.1016/S0167-2991(09)60711-4

M3 - Article

AN - SCOPUS:34447617975

SN - 0167-2991

VL - 38

SP - 835

EP - 843

JO - Studies in Surface Science and Catalysis

JF - Studies in Surface Science and Catalysis

IS - C

ER -

Fluorescence Yield Near Edge X-ray Absorption Fine Structure above the carbon K edge: A new method for characterizing adsorbed intermediates and surface reaction rates in the presence of reactive environments

ASJC Scopus Subject Areas

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