FDTD and FEM/MOM Modeling of EMI Resulting from a Trace Near a PCB Edge

Daniel P. Berg; Motoshi Tanaka; Yun Ji; Xiaoning Ye; James L. Drewniak; Todd H. Hubing; Richard E. DuBroff; Thomas Van Doren

doi:10.1109/ISEMC.2000.875551

FDTD and FEM/MOM Modeling of EMI Resulting from a Trace Near a PCB Edge

Daniel P. Berg
, Motoshi Tanaka
, Yun Ji
, Xiaoning Ye
, James L. Drewniak
, Todd H. Hubing
, Richard E. DuBroff
, Thomas Van Doren

Electrical and Computer Engineering

Missouri University of Science and Technology

Research output: Contribution to journal › Article › peer-review

Abstract

PCB traces routed near board edges and carrying high-speed signals are considered to contribute to EMI problems. Consequently, design maxims state that traces that might have intentional or unintentional high frequency components on them be kept away from board edges. This costs valuable surface area as boards become more densely designed. Further, design maxims concerning traces near board edges are not well quantified. The increase in EMI as a trace is routed increasingly closer to the PCB edge has been studied experimentally and with numerical modeling.

Original language	American English
Pages (from-to)	135-140
Number of pages	6
Journal	Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2000, Washington, D.C.)
Volume	1
DOIs	https://doi.org/10.1109/ISEMC.2000.875551
State	Published - Aug 1 2000
Event	2000 IEEE International Symposium on Electromagneti Compatibility - Washington, DC, USA Duration: Aug 21 2000 → Aug 25 2000

ASJC Scopus Subject Areas

Condensed Matter Physics
Electrical and Electronic Engineering

Keywords

EMI Problems
FDTD Modeling
FEM/MOM Modeling
PCB Edge
PCB Layout
PCB Traces
Design Maxims
Electromagnetic Interference
Experiment
Finite Difference Time-Domain Analysis
Finite Element Analysis
High Frequency Components
High-Speed Signals
Method of Moments
Numerical Modeling
Printed Circuit Design
Printed Circuit Layout
Trace Routing

Disciplines

Electrical and Computer Engineering

Access to Document

10.1109/ISEMC.2000.875551License: CC BY

FDTD and FEM MOM Modeling of EMI Resulting from a Trace Near a PCFinal published version, 705 KBLicense: CC BY

Cite this

@article{ab0ff114686c4237a22bde5b8d31d10b,

title = "FDTD and FEM/MOM Modeling of EMI Resulting from a Trace Near a PCB Edge",

abstract = " PCB traces routed near board edges and carrying high-speed signals are considered to contribute to EMI problems. Consequently, design maxims state that traces that might have intentional or unintentional high frequency components on them be kept away from board edges. This costs valuable surface area as boards become more densely designed. Further, design maxims concerning traces near board edges are not well quantified. The increase in EMI as a trace is routed increasingly closer to the PCB edge has been studied experimentally and with numerical modeling.",

keywords = "EMI Problems, FDTD Modeling, FEM/MOM Modeling, PCB Edge, PCB Layout, PCB Traces, Design Maxims, Electromagnetic Interference, Experiment, Finite Difference Time-Domain Analysis, Finite Element Analysis, High Frequency Components, High-Speed Signals, Method of Moments, Numerical Modeling, Printed Circuit Design, Printed Circuit Layout, Trace Routing",

author = "Berg, \{Daniel P.\} and Motoshi Tanaka and Yun Ji and Xiaoning Ye and Drewniak, \{James L.\} and Hubing, \{Todd H.\} and DuBroff, \{Richard E.\} and \{Van Doren\}, Thomas",

year = "2000",

month = aug,

day = "1",

doi = "10.1109/ISEMC.2000.875551",

language = "American English",

volume = "1",

pages = "135--140",

journal = "Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2000, Washington, D.C.)",

note = "2000 IEEE International Symposium on Electromagneti Compatibility ; Conference date: 21-08-2000 Through 25-08-2000",

}

TY - JOUR

T1 - FDTD and FEM/MOM Modeling of EMI Resulting from a Trace Near a PCB Edge

AU - Berg, Daniel P.

AU - Tanaka, Motoshi

AU - Ji, Yun

AU - Ye, Xiaoning

AU - Drewniak, James L.

AU - Hubing, Todd H.

AU - DuBroff, Richard E.

AU - Van Doren, Thomas

PY - 2000/8/1

Y1 - 2000/8/1

N2 - PCB traces routed near board edges and carrying high-speed signals are considered to contribute to EMI problems. Consequently, design maxims state that traces that might have intentional or unintentional high frequency components on them be kept away from board edges. This costs valuable surface area as boards become more densely designed. Further, design maxims concerning traces near board edges are not well quantified. The increase in EMI as a trace is routed increasingly closer to the PCB edge has been studied experimentally and with numerical modeling.

AB - PCB traces routed near board edges and carrying high-speed signals are considered to contribute to EMI problems. Consequently, design maxims state that traces that might have intentional or unintentional high frequency components on them be kept away from board edges. This costs valuable surface area as boards become more densely designed. Further, design maxims concerning traces near board edges are not well quantified. The increase in EMI as a trace is routed increasingly closer to the PCB edge has been studied experimentally and with numerical modeling.

KW - EMI Problems

KW - FDTD Modeling

KW - FEM/MOM Modeling

KW - PCB Edge

KW - PCB Layout

KW - PCB Traces

KW - Design Maxims

KW - Electromagnetic Interference

KW - Experiment

KW - Finite Difference Time-Domain Analysis

KW - Finite Element Analysis

KW - High Frequency Components

KW - High-Speed Signals

KW - Method of Moments

KW - Numerical Modeling

KW - Printed Circuit Design

KW - Printed Circuit Layout

KW - Trace Routing

UR - https://scholarsmine.mst.edu/ele_comeng_facwork/1628

U2 - 10.1109/ISEMC.2000.875551

DO - 10.1109/ISEMC.2000.875551

M3 - Article

VL - 1

SP - 135

EP - 140

JO - Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2000, Washington, D.C.)

JF - Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2000, Washington, D.C.)

T2 - 2000 IEEE International Symposium on Electromagneti Compatibility

Y2 - 21 August 2000 through 25 August 2000

ER -

FDTD and FEM/MOM Modeling of EMI Resulting from a Trace Near a PCB Edge

Abstract

ASJC Scopus Subject Areas

Keywords

Disciplines

Access to Document

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