Fault diagnosis in analog circuits IDDT based on wavelet transform and neural networks

Cheng Wang; Guangju Chen; Yongle Xie

Fault diagnosis in analog circuits I_DDT based on wavelet transform and neural networks

Cheng Wang
, Guangju Chen
, Yongle Xie

University of Electronic Science and Technology of China
Kangxun Corp. of ZTE

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	1106-1108
Number of pages	3
Journal	Yi Qi Yi Biao Xue Bao/Chinese Journal of Scientific Instrument
Volume	26
Issue number	11
State	Published - Nov 2005
Externally published	Yes

ASJC Scopus Subject Areas

Instrumentation

Keywords

Analog circuits
Fault diagnosis
Neural networks
Wavelet transform

Cite this

@article{a60978600b8848f1b88e268cfb9dc90b,

title = "Fault diagnosis in analog circuits IDDT based on wavelet transform and neural networks",

keywords = "Analog circuits, Fault diagnosis, Neural networks, Wavelet transform",

author = "Cheng Wang and Guangju Chen and Yongle Xie",

year = "2005",

month = nov,

language = "English",

volume = "26",

pages = "1106--1108",

journal = "Yi Qi Yi Biao Xue Bao/Chinese Journal of Scientific Instrument",

issn = "0254-3087",

number = "11",

}

TY - JOUR

T1 - Fault diagnosis in analog circuits IDDT based on wavelet transform and neural networks

AU - Wang, Cheng

AU - Chen, Guangju

AU - Xie, Yongle

PY - 2005/11

Y1 - 2005/11

KW - Analog circuits

KW - Fault diagnosis

KW - Neural networks

KW - Wavelet transform

UR - https://www.scopus.com/pages/publications/28744443973

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M3 - Article

AN - SCOPUS:28744443973

SN - 0254-3087

VL - 26

SP - 1106

EP - 1108

JO - Yi Qi Yi Biao Xue Bao/Chinese Journal of Scientific Instrument

JF - Yi Qi Yi Biao Xue Bao/Chinese Journal of Scientific Instrument

IS - 11

ER -

Fault diagnosis in analog circuits I_DDT based on wavelet transform and neural networks

ASJC Scopus Subject Areas

Keywords

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