Fast and accurate multi-layer PDN analysis for power integrity and EMC

Bruce Archambeault; Ketan Shringarpure; Jun Fan; Sam Connor

Fast and accurate multi-layer PDN analysis for power integrity and EMC

Bruce Archambeault
, Ketan Shringarpure
, Jun Fan
, Sam Connor

Electrical and Computer Engineering

IBM
Missouri University of Science and Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	43rd International Symposium on Microelectronics 2010, IMAPS 2010
Pages	566-571
Number of pages	6
State	Published - 2010
Event	43rd Annual IMAPS International Symposium on Microelectronics, IMAPS 2010 - Raleigh, NC, United States Duration: Oct 31 2010 → Nov 4 2010

Publication series

Name	43rd International Symposium on Microelectronics 2010, IMAPS 2010

Conference

Conference	43rd Annual IMAPS International Symposium on Microelectronics, IMAPS 2010
Country/Territory	United States
City	Raleigh, NC
Period	10/31/10 → 11/4/10

ASJC Scopus Subject Areas

Electrical and Electronic Engineering

Cite this

Fast and accurate multi-layer PDN analysis for power integrity and EMC. / Archambeault, Bruce; Shringarpure, Ketan; Fan, Jun et al.
43rd International Symposium on Microelectronics 2010, IMAPS 2010. 2010. p. 566-571 (43rd International Symposium on Microelectronics 2010, IMAPS 2010).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Archambeault, B, Shringarpure, K, Fan, J & Connor, S 2010, Fast and accurate multi-layer PDN analysis for power integrity and EMC. in 43rd International Symposium on Microelectronics 2010, IMAPS 2010. 43rd International Symposium on Microelectronics 2010, IMAPS 2010, pp. 566-571, 43rd Annual IMAPS International Symposium on Microelectronics, IMAPS 2010, Raleigh, NC, United States, 10/31/10.

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T1 - Fast and accurate multi-layer PDN analysis for power integrity and EMC

AU - Archambeault, Bruce

AU - Shringarpure, Ketan

AU - Fan, Jun

AU - Connor, Sam

PY - 2010

Y1 - 2010

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UR - https://www.scopus.com/pages/publications/84878193022#tab=citedBy

M3 - Conference contribution

AN - SCOPUS:84878193022

SN - 9781617823206

T3 - 43rd International Symposium on Microelectronics 2010, IMAPS 2010

SP - 566

EP - 571

BT - 43rd International Symposium on Microelectronics 2010, IMAPS 2010

T2 - 43rd Annual IMAPS International Symposium on Microelectronics, IMAPS 2010

Y2 - 31 October 2010 through 4 November 2010

ER -

Fast and accurate multi-layer PDN analysis for power integrity and EMC

Publication series

Conference

ASJC Scopus Subject Areas

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Cite this