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Far-field prediction using only magnetic near-field scanning for EMI test

  • Xu Gao
  • , Jun Fan
  • , Yaojiang Zhang
  • , Hamed Kajbaf
  • , David Pommerenke
  • Missouri University of Science and Technology

Research output: Contribution to journal › Article › peer-review

Original languageEnglish
Article number6819460
Pages (from-to)1335-1343
Number of pages9
JournalIEEE Transactions on Electromagnetic Compatibility
Volume56
Issue number6
DOIs
StatePublished - Dec 1 2014

ASJC Scopus Subject Areas

  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Keywords

  • Electromagnetic interference (EMI)
  • equivalence theorem
  • finite element methods (FEMs)
  • magnetic fields
  • near-field-far-field transformation

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