Abstract
Epitaxial cuprous oxide nanostructures with high aspect ratio were deposited electrochemically on n-InP(111) from aqueous solution at room temperature. High-resolution X-ray diffraction shows that the Cu 2 O and InP form three equivalent epitaxial orientation relationships that are rotated 120 relative to each other: Cu 2 O(110)[100] || InP(111)[10], Cu 2 O(110)[100] || InP(111)[01], and Cu 2 O(110)[100] || InP(111)[01]. the size and aspect ratio of the Cu 2 O nanostructures depend on the applied deposition current density. at a deposition current density of 0.125 mA/cm 2 , uniformly sized nanostructures 30 nm wide and 1000 nm long were obtained. Transmission electron microscopy reveals an amorphous, oxygen-rich interlayer and a crystalline Cu 3 P layer between the Cu 2 O and InP.
| Original language | American English |
|---|---|
| Pages (from-to) | 725-729 |
| Number of pages | 5 |
| Journal | Chemistry of Materials |
| Volume | 17 |
| Issue number | 4 |
| DOIs | |
| State | Published - Jan 1 2005 |
Keywords
- Epitaxy
- Nanostructures
Disciplines
- Chemistry
- Materials Science and Engineering
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