Electrical Material Property Measurements using a Free-Field, Ultra-Wideband System [Dielectric Measurements]

C. A. Grosvenor; R. Johnk; D. Novotny; S. Canales; J. Baker-Jarvis; M. Janezic; James L. Drewniak; Marina Koledintseva; Jianmin Zhang; Poorna Chander Ravva

doi:10.1109/CEIDP.2004.1364217

Electrical Material Property Measurements using a Free-Field, Ultra-Wideband System [Dielectric Measurements]

C. A. Grosvenor
, R. Johnk
, D. Novotny
, S. Canales
, J. Baker-Jarvis
, M. Janezic
, James L. Drewniak
, Marina Koledintseva
, Jianmin Zhang
, Poorna Chander Ravva

Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

We present nondestructive measurements of material properties using TEM horn antennas and an ultra-wideband measurement system. Time-domain gating and genetic algorithms are used to process the data and extract the dielectric properties of the material under test.

Original language	American English
Journal	Proceedings of the Conference on Electrical Insulation and Dielectric Phenomena (2004, Boulder, CO)
DOIs	https://doi.org/10.1109/CEIDP.2004.1364217
State	Published - Oct 1 2004

Keywords

300 KHz to 4000 MHz
TEM Horn Antennas
Dielectric Measurement
Dielectric Properties Measurements
Electrical Material Property Measurements
Free-Field Ultra-Wideband System
Genetic Algorithms
Horn Antennas
Microwave Measurement
Network Analysers
Nondestructive Measurement
Short-Impulse-Response Antennas
Time-Domain Gating
Vector Network Analyzer
Electrical Materials
Material Parameters
Material Properties
Ultra-Wideband Systems
Dielectric Properties
Measurements
Nondestructive Examination
Time Domain Analysis
Transmission Electron Microscopy
Broadband Networks

Disciplines

Electrical and Computer Engineering

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10.1109/CEIDP.2004.1364217License: CC BY

Electrical Material Property Measurements using a Free-Field UltFinal published version, 372 KBLicense: CC BY

Cite this

Grosvenor, C. A., Johnk, R., Novotny, D., Canales, S., Baker-Jarvis, J., Janezic, M., Drewniak, J. L., Koledintseva, M., Zhang, J., & Ravva, P. C. (2004). Electrical Material Property Measurements using a Free-Field, Ultra-Wideband System [Dielectric Measurements]. Proceedings of the Conference on Electrical Insulation and Dielectric Phenomena (2004, Boulder, CO). https://doi.org/10.1109/CEIDP.2004.1364217

Grosvenor, CA, Johnk, R, Novotny, D, Canales, S, Baker-Jarvis, J, Janezic, M, Drewniak, JL , Koledintseva, M , Zhang, J & Ravva, PC 2004, 'Electrical Material Property Measurements using a Free-Field, Ultra-Wideband System [Dielectric Measurements]', Proceedings of the Conference on Electrical Insulation and Dielectric Phenomena (2004, Boulder, CO). https://doi.org/10.1109/CEIDP.2004.1364217

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abstract = " We present nondestructive measurements of material properties using TEM horn antennas and an ultra-wideband measurement system. Time-domain gating and genetic algorithms are used to process the data and extract the dielectric properties of the material under test.",

keywords = "300 KHz to 4000 MHz, TEM Horn Antennas, Dielectric Measurement, Dielectric Properties Measurements, Electrical Material Property Measurements, Free-Field Ultra-Wideband System, Genetic Algorithms, Horn Antennas, Microwave Measurement, Network Analysers, Nondestructive Measurement, Short-Impulse-Response Antennas, Time-Domain Gating, Vector Network Analyzer, Electrical Materials, Material Parameters, Material Properties, Ultra-Wideband Systems, Dielectric Properties, Measurements, Nondestructive Examination, Time Domain Analysis, Transmission Electron Microscopy, Broadband Networks",

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doi = "10.1109/CEIDP.2004.1364217",

language = "American English",

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T1 - Electrical Material Property Measurements using a Free-Field, Ultra-Wideband System [Dielectric Measurements]

AU - Grosvenor, C. A.

AU - Johnk, R.

AU - Novotny, D.

AU - Canales, S.

AU - Baker-Jarvis, J.

AU - Janezic, M.

AU - Drewniak, James L.

AU - Koledintseva, Marina

AU - Zhang, Jianmin

AU - Ravva, Poorna Chander

PY - 2004/10/1

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N2 - We present nondestructive measurements of material properties using TEM horn antennas and an ultra-wideband measurement system. Time-domain gating and genetic algorithms are used to process the data and extract the dielectric properties of the material under test.

AB - We present nondestructive measurements of material properties using TEM horn antennas and an ultra-wideband measurement system. Time-domain gating and genetic algorithms are used to process the data and extract the dielectric properties of the material under test.

KW - 300 KHz to 4000 MHz

KW - TEM Horn Antennas

KW - Dielectric Measurement

KW - Dielectric Properties Measurements

KW - Electrical Material Property Measurements

KW - Free-Field Ultra-Wideband System

KW - Genetic Algorithms

KW - Horn Antennas

KW - Microwave Measurement

KW - Network Analysers

KW - Nondestructive Measurement

KW - Short-Impulse-Response Antennas

KW - Time-Domain Gating

KW - Vector Network Analyzer

KW - Electrical Materials

KW - Material Parameters

KW - Material Properties

KW - Ultra-Wideband Systems

KW - Dielectric Properties

KW - Measurements

KW - Nondestructive Examination

KW - Time Domain Analysis

KW - Transmission Electron Microscopy

KW - Broadband Networks

UR - https://scholarsmine.mst.edu/ele_comeng_facwork/1577

U2 - 10.1109/CEIDP.2004.1364217

DO - 10.1109/CEIDP.2004.1364217

M3 - Article

JO - Proceedings of the Conference on Electrical Insulation and Dielectric Phenomena (2004, Boulder, CO)

JF - Proceedings of the Conference on Electrical Insulation and Dielectric Phenomena (2004, Boulder, CO)

ER -

Electrical Material Property Measurements using a Free-Field, Ultra-Wideband System [Dielectric Measurements]

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Keywords

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