Determination of the Thickness and Dielectric Constant of a Dielectric Slab Backed by Free-Space or a Conductor through Inversion of the Reflection Coefficient of a Rectangular Waveguide Probe

Jesse Lai; Dana M. Hughes; Eric Gallaher; R. Zoughi

doi:10.1109/IMTC.2004.1350994

Determination of the Thickness and Dielectric Constant of a Dielectric Slab Backed by Free-Space or a Conductor through Inversion of the Reflection Coefficient of a Rectangular Waveguide Probe

Jesse Lai
, Dana M. Hughes
, Eric Gallaher
, R. Zoughi

Research output: Contribution to journal › Article › peer-review

Abstract

Evaluation of thickness and material properties of coatings and dielectric slabs is an important practical issue. Microwave nondestructive testing techniques, using open-ended rectangular waveguide and coaxial probes have shown great potential for this purpose. However, to evaluate one parameter requires that the other be known a priori. This paper discusses the use of a relatively efficient method for evaluating both parameters simultaneously from measurements of the reflection coefficient of a test material. Results of two cases as well as a brief discussion of the limitations of the technique are provided in this paper.

Original language	American English
Journal	Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (2004, Como, Italy)
Volume	1
DOIs	https://doi.org/10.1109/IMTC.2004.1350994
State	Published - May 1 2004

Keywords

Coatings
Coaxial Cables
Coaxial Probes
Composites
Conductor
Dielectric Constant
Dielectric Materials
Dielectric Properties
Dielectric Slab Thickness
Electromagnetic Wave Reflection
Free-Space
Material Properties
Microwave Measurement
Microwave Nondestructive Testing
Microwaves
Nondestructive Testing
Open-Ended Rectangular Waveguide
Probes
Rectangular Waveguide Probe
Rectangular Waveguides
Reflection Coefficient Inversion
Thickness Measurement

Disciplines

Electrical and Computer Engineering

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Lai, J., Hughes, D. M., Gallaher, E., & Zoughi, R. (2004). Determination of the Thickness and Dielectric Constant of a Dielectric Slab Backed by Free-Space or a Conductor through Inversion of the Reflection Coefficient of a Rectangular Waveguide Probe. Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (2004, Como, Italy), 1. https://doi.org/10.1109/IMTC.2004.1350994

Determination of the Thickness and Dielectric Constant of a Dielectric Slab Backed by Free-Space or a Conductor through Inversion of the Reflection Coefficient of a Rectangular Waveguide Probe. / Lai, Jesse; Hughes, Dana M.; Gallaher, Eric et al.
In: Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (2004, Como, Italy), Vol. 1, 01.05.2004.

Research output: Contribution to journal › Article › peer-review

Lai, J, Hughes, DM, Gallaher, E & Zoughi, R 2004, 'Determination of the Thickness and Dielectric Constant of a Dielectric Slab Backed by Free-Space or a Conductor through Inversion of the Reflection Coefficient of a Rectangular Waveguide Probe', Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (2004, Como, Italy), vol. 1. https://doi.org/10.1109/IMTC.2004.1350994

Lai J, Hughes DM, Gallaher E, Zoughi R. Determination of the Thickness and Dielectric Constant of a Dielectric Slab Backed by Free-Space or a Conductor through Inversion of the Reflection Coefficient of a Rectangular Waveguide Probe. Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (2004, Como, Italy). 2004 May 1;1. doi: 10.1109/IMTC.2004.1350994

Lai, Jesse ; Hughes, Dana M. ; Gallaher, Eric et al. / Determination of the Thickness and Dielectric Constant of a Dielectric Slab Backed by Free-Space or a Conductor through Inversion of the Reflection Coefficient of a Rectangular Waveguide Probe. In: Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (2004, Como, Italy). 2004 ; Vol. 1.

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title = "Determination of the Thickness and Dielectric Constant of a Dielectric Slab Backed by Free-Space or a Conductor through Inversion of the Reflection Coefficient of a Rectangular Waveguide Probe",

abstract = " Evaluation of thickness and material properties of coatings and dielectric slabs is an important practical issue. Microwave nondestructive testing techniques, using open-ended rectangular waveguide and coaxial probes have shown great potential for this purpose. However, to evaluate one parameter requires that the other be known a priori. This paper discusses the use of a relatively efficient method for evaluating both parameters simultaneously from measurements of the reflection coefficient of a test material. Results of two cases as well as a brief discussion of the limitations of the technique are provided in this paper.",

keywords = "Coatings, Coaxial Cables, Coaxial Probes, Composites, Conductor, Dielectric Constant, Dielectric Materials, Dielectric Properties, Dielectric Slab Thickness, Electromagnetic Wave Reflection, Free-Space, Material Properties, Microwave Measurement, Microwave Nondestructive Testing, Microwaves, Nondestructive Testing, Open-Ended Rectangular Waveguide, Probes, Rectangular Waveguide Probe, Rectangular Waveguides, Reflection Coefficient Inversion, Thickness Measurement",

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AU - Gallaher, Eric

AU - Zoughi, R.

PY - 2004/5/1

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N2 - Evaluation of thickness and material properties of coatings and dielectric slabs is an important practical issue. Microwave nondestructive testing techniques, using open-ended rectangular waveguide and coaxial probes have shown great potential for this purpose. However, to evaluate one parameter requires that the other be known a priori. This paper discusses the use of a relatively efficient method for evaluating both parameters simultaneously from measurements of the reflection coefficient of a test material. Results of two cases as well as a brief discussion of the limitations of the technique are provided in this paper.

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KW - Coatings

KW - Coaxial Cables

KW - Coaxial Probes

KW - Composites

KW - Conductor

KW - Dielectric Constant

KW - Dielectric Materials

KW - Dielectric Properties

KW - Dielectric Slab Thickness

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KW - Free-Space

KW - Material Properties

KW - Microwave Measurement

KW - Microwave Nondestructive Testing

KW - Microwaves

KW - Nondestructive Testing

KW - Open-Ended Rectangular Waveguide

KW - Probes

KW - Rectangular Waveguide Probe

KW - Rectangular Waveguides

KW - Reflection Coefficient Inversion

KW - Thickness Measurement

UR - https://scholarsmine.mst.edu/ele_comeng_facwork/971

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DO - 10.1109/IMTC.2004.1350994

M3 - Article

VL - 1

JO - Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (2004, Como, Italy)

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ER -

Determination of the Thickness and Dielectric Constant of a Dielectric Slab Backed by Free-Space or a Conductor through Inversion of the Reflection Coefficient of a Rectangular Waveguide Probe

Abstract

Keywords

Disciplines

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