Determination of the electron escape depth for NEXAFS spectroscopy

K. E. Sohn; M. D. Dimitriou; J. Genzer; D. A. Fischer; C. J. Hawker; E. J. Kramer

doi:10.1021/la803951y

Determination of the electron escape depth for NEXAFS spectroscopy

K. E. Sohn
, M. D. Dimitriou
, J. Genzer
, D. A. Fischer
, C. J. Hawker
, E. J. Kramer

University of California
North Carolina State University
National Institute of Standards and Technology
University of California at Santa Barbara

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	6341-6348
Number of pages	8
Journal	Langmuir
Volume	25
Issue number	11
DOIs	https://doi.org/10.1021/la803951y
State	Published - Jun 2 2009
Externally published	Yes

ASJC Scopus Subject Areas

General Materials Science
Condensed Matter Physics
Surfaces and Interfaces
Spectroscopy
Electrochemistry

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10.1021/la803951y

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title = "Determination of the electron escape depth for NEXAFS spectroscopy",

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year = "2009",

month = jun,

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doi = "10.1021/la803951y",

language = "English",

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journal = "Langmuir",

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T1 - Determination of the electron escape depth for NEXAFS spectroscopy

AU - Sohn, K. E.

AU - Dimitriou, M. D.

AU - Genzer, J.

AU - Fischer, D. A.

AU - Hawker, C. J.

AU - Kramer, E. J.

PY - 2009/6/2

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DO - 10.1021/la803951y

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VL - 25

SP - 6341

EP - 6348

JO - Langmuir

JF - Langmuir

IS - 11

ER -

Determination of the electron escape depth for NEXAFS spectroscopy

ASJC Scopus Subject Areas

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