Abstract
This paper presents the design of serial chip-to-chip communication at 20 Gbps including modeling and correlation for PCBs (Printed Circuit Boards) with FR4 substrate materials. The entire channel under investigation includes two packages, a 21-layer ceramic and a 12-layer organic, and a 22-layer PCB. A probing station, microprobes and a VNA are used to measure the entire channel S-parameters and the measurement is correlated to the simulation up to 20 GHz. Extended study for the channel with low loss PCB substrate material is simulated. Time-domain eye comparisons for the FR4 channel, low loss channel, and the FR4 channel with equalization are given. A general design rule as well as new technologies for the high-speed channel design at 20 Gbps and beyond are discussed and given in the conclusion.
| Original language | American English |
|---|---|
| Journal | Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2010, Fort Lauderdale, FL) |
| DOIs | |
| State | Published - Jul 1 2010 |
Keywords
- Chip-to-Chip Communications
- Design
- Design And Modeling
- Design Rules
- Electromagnetic Compatibility
- Electromagnetism
- Electronic Equipment Manufacture
- FR4 Substrates
- High-Speed Channels
- Low Loss
- Micro-Probes
- New Technologies
- Printed Circuit Boards
- Printed Circuit Design
- S-Parameters
- Scattering Parameters
- Substrate Material
- Time Domain
Disciplines
- Electrical and Computer Engineering
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