Delaunay tessellation and topological regression: An application to estimating product properties from spectroscopic measurements

Francesco Corona; Elia Lütiäinen; Amaury Lendasse; Roberto Baratti; Lorenzo Sassu

doi:10.1016/S1570-7946(09)70587-5

Delaunay tessellation and topological regression: An application to estimating product properties from spectroscopic measurements

Francesco Corona
, Elia Lütiäinen
, Amaury Lendasse
, Roberto Baratti
, Lorenzo Sassu

Aalto University
University of Cagliari
Sartec - Saras Ricerche e Tecnologie, S.p.A. Strada 5 Traversa C

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	1179-1184
Number of pages	6
Journal	Computer Aided Chemical Engineering
Volume	27
Issue number	C
DOIs	https://doi.org/10.1016/S1570-7946(09)70587-5
State	Published - 2009
Externally published	Yes

ASJC Scopus Subject Areas

General Chemical Engineering
Computer Science Applications

Keywords

Delaunay tessellation
Multivariate calibration
Nearestneighbor regression
Process monitoring

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10.1016/S1570-7946(09)70587-5

Cite this

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title = "Delaunay tessellation and topological regression: An application to estimating product properties from spectroscopic measurements",

keywords = "Delaunay tessellation, Multivariate calibration, Nearestneighbor regression, Process monitoring",

author = "Francesco Corona and Elia L{\"u}ti{\"a}inen and Amaury Lendasse and Roberto Baratti and Lorenzo Sassu",

year = "2009",

doi = "10.1016/S1570-7946(09)70587-5",

language = "English",

volume = "27",

pages = "1179--1184",

journal = "Computer Aided Chemical Engineering",

issn = "1570-7946",

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T1 - Delaunay tessellation and topological regression

T2 - An application to estimating product properties from spectroscopic measurements

AU - Corona, Francesco

AU - Lütiäinen, Elia

AU - Lendasse, Amaury

AU - Baratti, Roberto

AU - Sassu, Lorenzo

PY - 2009

Y1 - 2009

KW - Delaunay tessellation

KW - Multivariate calibration

KW - Nearestneighbor regression

KW - Process monitoring

UR - https://www.scopus.com/pages/publications/77649298810

UR - https://www.scopus.com/pages/publications/77649298810#tab=citedBy

U2 - 10.1016/S1570-7946(09)70587-5

DO - 10.1016/S1570-7946(09)70587-5

M3 - Article

AN - SCOPUS:77649298810

SN - 1570-7946

VL - 27

SP - 1179

EP - 1184

JO - Computer Aided Chemical Engineering

JF - Computer Aided Chemical Engineering

IS - C

ER -

Delaunay tessellation and topological regression: An application to estimating product properties from spectroscopic measurements

ASJC Scopus Subject Areas

Keywords

Access to Document

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