De-Embedding Techniques for Transmission Lines: An Application to Measurements of On-Chip Coplanar Traces

Nicholas Erickson; Jun Fan; Xu Gao; Brice Achkir; Siming Pan

doi:10.1109/ISEMC.2014.6899052

De-Embedding Techniques for Transmission Lines: An Application to Measurements of On-Chip Coplanar Traces

Nicholas Erickson
, Jun Fan
, Xu Gao
, Brice Achkir
, Siming Pan

Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

In this paper, the de-embedding study presented in [1] is extended from the simulation environment to the measurement environment; the three presented de-embedding methods are applied to measurements of on-chip coplanar traces for two different test ICs. Additionally, the Hybrid technique presented in [1] is reformulated so that only two measurement standards are required, as opposed to three. The results of de-embedding the measurement data are discussed, as well as challenges with making the measurements.

Original language	American English
Journal	Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2014, Raleigh, NC)
DOIs	https://doi.org/10.1109/ISEMC.2014.6899052
State	Published - Aug 8 2014

Keywords

De-embedding
De-embedding method
De-embedding techniques
Electromagnetic compatibility
Hybrid techniques
Measurement data
Measurement standards
Measurements of
Simulation environment

Disciplines

Electrical and Computer Engineering
Numerical Analysis and Scientific Computing

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10.1109/ISEMC.2014.6899052License: Unspecified

https://doi.org/10.1109/ISEMC.2014.6899052

Cite this

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title = "De-Embedding Techniques for Transmission Lines: An Application to Measurements of On-Chip Coplanar Traces",

abstract = " In this paper, the de-embedding study presented in [1] is extended from the simulation environment to the measurement environment; the three presented de-embedding methods are applied to measurements of on-chip coplanar traces for two different test ICs. Additionally, the Hybrid technique presented in [1] is reformulated so that only two measurement standards are required, as opposed to three. The results of de-embedding the measurement data are discussed, as well as challenges with making the measurements.",

keywords = "De-embedding, De-embedding method, De-embedding techniques, Electromagnetic compatibility, Hybrid techniques, Measurement data, Measurement standards, Measurements of, Simulation environment",

author = "Nicholas Erickson and Jun Fan and Xu Gao and Brice Achkir and Siming Pan",

year = "2014",

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doi = "10.1109/ISEMC.2014.6899052",

language = "American English",

journal = "Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2014, Raleigh, NC)",

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T1 - De-Embedding Techniques for Transmission Lines: An Application to Measurements of On-Chip Coplanar Traces

AU - Erickson, Nicholas

AU - Fan, Jun

AU - Gao, Xu

AU - Achkir, Brice

AU - Pan, Siming

PY - 2014/8/8

Y1 - 2014/8/8

N2 - In this paper, the de-embedding study presented in [1] is extended from the simulation environment to the measurement environment; the three presented de-embedding methods are applied to measurements of on-chip coplanar traces for two different test ICs. Additionally, the Hybrid technique presented in [1] is reformulated so that only two measurement standards are required, as opposed to three. The results of de-embedding the measurement data are discussed, as well as challenges with making the measurements.

AB - In this paper, the de-embedding study presented in [1] is extended from the simulation environment to the measurement environment; the three presented de-embedding methods are applied to measurements of on-chip coplanar traces for two different test ICs. Additionally, the Hybrid technique presented in [1] is reformulated so that only two measurement standards are required, as opposed to three. The results of de-embedding the measurement data are discussed, as well as challenges with making the measurements.

KW - De-embedding

KW - De-embedding method

KW - De-embedding techniques

KW - Electromagnetic compatibility

KW - Hybrid techniques

KW - Measurement data

KW - Measurement standards

KW - Measurements of

KW - Simulation environment

UR - https://scholarsmine.mst.edu/ele_comeng_facwork/2057

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DO - 10.1109/ISEMC.2014.6899052

M3 - Article

JO - Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2014, Raleigh, NC)

JF - Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2014, Raleigh, NC)

ER -

De-Embedding Techniques for Transmission Lines: An Application to Measurements of On-Chip Coplanar Traces

Abstract

Keywords

Disciplines

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