De-Embedding Comparisons of 1X-Reflect SFD, 1-Port AFR, and 2X-Thru SFD

Yuan Chen; Bichen Chen; Jiayi He; Richard Zai; Jun Fan; James L. Drewniak

doi:10.1109/ISEMC.2018.8393759

De-Embedding Comparisons of 1X-Reflect SFD, 1-Port AFR, and 2X-Thru SFD

Yuan Chen
, Bichen Chen
, Jiayi He
, Richard Zai
, Jun Fan
, James L. Drewniak

Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

The procedures of lX-Reflect Smart Fixture De-embedding (SFD), 1-Port Auto Fixture Removal (AFR), and 2X-Thru SFD are compared from various perspectives: test fixture design, the de-embedding procedure, and the de-embedded results. The accuracy of the fixture characterization and de-embedded result is the key figure of merit (FOM) in each de-embedding method. Full-wave models were built to evaluate the FOM of these three methods, by comparing the scattering parameters (S-parameters) and TDR. A test coupon for measuring the USB-C cables is adopted to serve as manufactured validation purpose.

Original language	American English
Journal	Proceedings of the 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (2018, Singapore, Singapore)
DOIs	https://doi.org/10.1109/ISEMC.2018.8393759
State	Published - May 1 2018

Keywords

1-PortAFR
2X-Thru SFD
De-embedding
Full-wave model
LX-Reflect SFD
USB-C

Disciplines

Electrical and Computer Engineering

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10.1109/ISEMC.2018.8393759License: CC BY

https://doi.org/10.1109/ISEMC.2018.8393759

Cite this

Chen, Y., Chen, B., He, J., Zai, R., Fan, J., & Drewniak, J. L. (2018). De-Embedding Comparisons of 1X-Reflect SFD, 1-Port AFR, and 2X-Thru SFD. Proceedings of the 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (2018, Singapore, Singapore). https://doi.org/10.1109/ISEMC.2018.8393759

De-Embedding Comparisons of 1X-Reflect SFD, 1-Port AFR, and 2X-Thru SFD. / Chen, Yuan; Chen, Bichen; He, Jiayi et al.
In: Proceedings of the 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (2018, Singapore, Singapore), 01.05.2018.

Research output: Contribution to journal › Article › peer-review

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title = "De-Embedding Comparisons of 1X-Reflect SFD, 1-Port AFR, and 2X-Thru SFD",

abstract = " The procedures of lX-Reflect Smart Fixture De-embedding (SFD), 1-Port Auto Fixture Removal (AFR), and 2X-Thru SFD are compared from various perspectives: test fixture design, the de-embedding procedure, and the de-embedded results. The accuracy of the fixture characterization and de-embedded result is the key figure of merit (FOM) in each de-embedding method. Full-wave models were built to evaluate the FOM of these three methods, by comparing the scattering parameters (S-parameters) and TDR. A test coupon for measuring the USB-C cables is adopted to serve as manufactured validation purpose.",

keywords = "1-PortAFR, 2X-Thru SFD, De-embedding, Full-wave model, LX-Reflect SFD, USB-C",

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AU - Drewniak, James L.

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N2 - The procedures of lX-Reflect Smart Fixture De-embedding (SFD), 1-Port Auto Fixture Removal (AFR), and 2X-Thru SFD are compared from various perspectives: test fixture design, the de-embedding procedure, and the de-embedded results. The accuracy of the fixture characterization and de-embedded result is the key figure of merit (FOM) in each de-embedding method. Full-wave models were built to evaluate the FOM of these three methods, by comparing the scattering parameters (S-parameters) and TDR. A test coupon for measuring the USB-C cables is adopted to serve as manufactured validation purpose.

AB - The procedures of lX-Reflect Smart Fixture De-embedding (SFD), 1-Port Auto Fixture Removal (AFR), and 2X-Thru SFD are compared from various perspectives: test fixture design, the de-embedding procedure, and the de-embedded results. The accuracy of the fixture characterization and de-embedded result is the key figure of merit (FOM) in each de-embedding method. Full-wave models were built to evaluate the FOM of these three methods, by comparing the scattering parameters (S-parameters) and TDR. A test coupon for measuring the USB-C cables is adopted to serve as manufactured validation purpose.

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De-Embedding Comparisons of 1X-Reflect SFD, 1-Port AFR, and 2X-Thru SFD

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