Continuous-time calibration of VLSI sensors for gain and offset variations

John G. Harris

doi:10.1117/12.210573.full

Continuous-time calibration of VLSI sensors for gain and offset variations

John G. Harris

EE Dept.
University of Florida

Research output: Contribution to journal › Conference article › peer-review

Original language	English
Pages (from-to)	23-33
Number of pages	11
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	2474
DOIs	https://doi.org/10.1117/12.210573.full
State	Published - May 30 1995
Externally published	Yes
Event	Smart Focal Plane Arrays and Focal Plane Array Testing 1995 - Orlando, United States Duration: Apr 17 1995 → Apr 21 1995

ASJC Scopus Subject Areas

Electronic, Optical and Magnetic Materials
Instrumentation
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

Keywords

Infrared Focal Point Arrays
Nonuniformity correction
Sensor calibration

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10.1117/12.210573.full

Cite this

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title = "Continuous-time calibration of VLSI sensors for gain and offset variations",

keywords = "Infrared Focal Point Arrays, Nonuniformity correction, Sensor calibration",

author = "Harris, \{John G.\}",

note = "Publisher Copyright: {\textcopyright} 1995 SPIE.; Smart Focal Plane Arrays and Focal Plane Array Testing 1995 ; Conference date: 17-04-1995 Through 21-04-1995",

year = "1995",

month = may,

day = "30",

doi = "10.1117/12.210573.full",

language = "English",

volume = "2474",

pages = "23--33",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

}

TY - JOUR

T1 - Continuous-time calibration of VLSI sensors for gain and offset variations

AU - Harris, John G.

PY - 1995/5/30

Y1 - 1995/5/30

KW - Infrared Focal Point Arrays

KW - Nonuniformity correction

KW - Sensor calibration

UR - https://www.scopus.com/pages/publications/0001855198

UR - https://www.scopus.com/pages/publications/0001855198#tab=citedBy

U2 - 10.1117/12.210573.full

DO - 10.1117/12.210573.full

M3 - Conference article

AN - SCOPUS:0001855198

SN - 0277-786X

VL - 2474

SP - 23

EP - 33

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Smart Focal Plane Arrays and Focal Plane Array Testing 1995

Y2 - 17 April 1995 through 21 April 1995

ER -

Continuous-time calibration of VLSI sensors for gain and offset variations

ASJC Scopus Subject Areas

Keywords

Access to Document

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