Abstract
This paper is focused on the construction of a conducted-emission model for a switched-mode power supply (SMPS). First, the total voltage source is extracted by measurement. Second, the coupling path between the aggressor and the victim is characterized by both simulation and measurement. Finally, the coupled noise to the victim with respect to the extracted total voltage source can be obtained by both simulation and calculation. Both results match well with the measurement result, which validates the robustness of the constructed model.
| Original language | American English |
|---|---|
| Journal | Proceedings of the 2015 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity (2015, Santa Clara, CA) |
| DOIs | |
| State | Published - Mar 21 2015 |
Keywords
- Broadband noise
- Conducted emissions
- Coupling paths
- Electromagnetic Interference (EMI)
- Electromagnetic pulse
- Shape memory effect
- Signal interference
- Simulation and calculations
- Simulations and measurements
- Standby power systems
- Switched mode power supplies
- Total voltage
- Voltage source
Disciplines
- Electrical and Computer Engineering
- Numerical Analysis and Scientific Computing
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