Skip to main navigation Skip to search Skip to main content

Closed-Form Expressions for the Noise Voltage Caused by a Burst Train of IC Switching Currents on a Power Distribution Network

  • Jingook Kim
  • , Jongjoo Lee
  • , Seungyoung Ahn
  • , Jun Fan

Research output: Contribution to journal › Article › peer-review

Abstract

A burst stimulus of data is a common activity in circuits and systems. The supply noise voltage waveform induced by a burst train of integrated circuit (IC) switching currents is rigorously derived for a power distribution network (PDN) with power traces, commonly used in handheld devices. Closed-form expressions are proposed to quickly estimate the amount of voltage drop and overshoot and to develop more complete PDN design methodology as improved target impedances. The proposed PDN noise expressions are also validated with SPICE simulation and measurements using a fabricated IC and PCB.

Original languageAmerican English
JournalIEEE Transactions on Electromagnetic Compatibility
Volume56
DOIs
StatePublished - Dec 1 2014

Keywords

  • Burst noise
  • Burst patterns
  • Electric network analysis
  • Power distribution network
  • SPICE
  • Switching currents
  • Target impedances
  • Transient noise
  • overshoot

Disciplines

  • Electrical and Computer Engineering
  • Numerical Analysis and Scientific Computing

Fingerprint

Dive into the research topics of 'Closed-Form Expressions for the Noise Voltage Caused by a Burst Train of IC Switching Currents on a Power Distribution Network'. Together they form a unique fingerprint.

Cite this