@article{f2110611a37b406d8691c184ad3d3ff7,
title = "Characterizing interfacial sliding of through-silicon-via by nano-indentation",
keywords = "Interfacial sliding, Nanoindentation, Through-silicon via, Traction-separation relation",
author = "Chenglin Wu and Rui Huang and Liechti, \{Kenneth M.\}",
note = "Publisher Copyright: {\textcopyright} 2017 IEEE.",
year = "2017",
month = jun,
doi = "10.1109/TDMR.2017.2681580",
language = "English",
volume = "17",
pages = "355--363",
journal = "IEEE Transactions on Device and Materials Reliability",
issn = "1530-4388",
number = "2",
}